Specimen holder used for mounting samples in electron microscopes
A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
1. An electron microscope specimen holder comprising a body, a clipping means, a spring, a viewing region, and at least one guide mechanism, wherein the clipping means comprise an article of manufacture having a top surface, a bottom surface, a first end, a securing means, a second end, and at least one electrical contact integrated on and/or in the bottom surface of the article, and wherein the spring is in contact with the bottom surface of the second end of the article and, provides constant force to displace the first end of the article, and, wherein the securing means are positioned between the first end and the second end of the article.
2. The specimen holder of claim 1 , wherein the securing means comprise a pivot positioned between the first end and the second end of the article.
3. The specimen holder of claim 1 , wherein the second end of the article is pivotally raised by applying downward pressure to the top surface of the first end of the article for insertion of a specimen support device between the bottom surface of the second end of the article and a top surface of the body.
4. The specimen holder of claim 1 , wherein the article is pivotally lowered such that at least one electrical lead of a specimen support device substantially contacts at least one electrical contact of the article.
5. The specimen holder of claim 1 , wherein the at least one electrical contact extends from the second end of the article, terminates at the second end of the article, or terminates before the second end of the article.
6. The specimen holder of claim 1 , wherein the at least one electrical contact of the clipping means extends from the clipping means to a barrel, from the barrel to an end, and onto an electrical connector.
7. The specimen holder of claim 1 , wherein the specimen holder is inserted into an electron microscope.
8. The specimen holder of claim 1 , further comprising a specimen support device mechanically secured between the clipping means and the body.
9. The specimen holder of claim 8 , wherein the specimen support device comprises a frame, at least one electrical lead and at least one membrane region.
10. The specimen holder of claim 8 , wherein the specimen support device is aligned using a depth stop and optionally, at least one additional guide mechanism, such that at least one electrical lead of the specimen support device substantially contacts at least one electrical contact of the article.
11. The specimen holder of claim 1 , wherein the specimen support device is aligned using the depth stop and optionally, at least one additional guide mechanism, such that the viewing region and the at least one membrane region of the specimen support device substantially correspond.
12. The specimen holder of claim 1 , wherein the at least one additional guide mechanism comprises guide screws.
13. A method of using a specimen holder in electron microscopy, said method comprising:
positioning a specimen support device in the specimen holder of claim 1 ; and
inserting said specimen holder in an electron microscope.
14. The method of claim 13 , wherein a specimen is on the specimen support device and an electron beam is controlled to form an image of the specimen.
15. The specimen holder of claim 1 , wherein the guide mechanism provides lateral alignment to a device as it is loaded.
16. The specimen holder of claim 1 , wherein the spring is any object that has a spring constant (k) and exerts a force onto a specimen support device.
17. The specimen holder of claim 1 , wherein the at least one guide mechanism is positioned on a top surface of the body.
18. The specimen holder of claim 1 , further comprising a set screw which prevents the spring from being over-compressed when a device is loaded into the specimen holder.
19. A method of providing an electrical contact between a specimen and a specimen holder of an electron microscope, said method comprising: positioning a specimen on a specimen support device, wherein the specimen support device comprises a frame, at least one electrical lead and at least one membrane region; and inserting the specimen support device in a specimen holder, wherein the specimen holder comprises a body, a clipping means, a spring, a viewing region, and at least one guide mechanism, wherein the clipping means comprise an article of manufacture having a top surface, a bottom surface, a first end, a securing means, a second end, and at least one electrical contact integrated on and/or in a bottom surface of the article, wherein the spring is in contact with the bottom surface of the second end of the article and, provides constant force to displace the first end of the article; wherein the securing means are positioned between the first end and the second end of the article; and wherein at least one electrical lead of the device substantially contacts at least one electrical contact of the clipping means.