IP Library Granted Patent US 8,865,121
Granted Patent B2
US 8,865,121 · App. 12/486,983 · Granted Oct 21, 2014

Organotemplate-free synthetic process for the production of a zeolitic material

Inventors: Feng-Shou Xiao (Jilin, CN); Bin Xie (Jilin, CN); Ulrich Mueller (Neustadt, DE); Bilge Yilmaz (Mannheim, DE)
Assignee: BASF SE
B01J29/7007C10G11/18B01D2257/80B01D2251/2067B01D2251/2062B01D2255/502B01D53/9413B01D53/94C10G2300/405Y02C20/10B01D2257/404B01D53/02B01J29/7615B01J37/0009C01B39/46B01D2257/402B01J35/04B01J35/1023B01J29/7415B01J29/88B01J35/002B01J35/1019B01D2257/406B01D2257/702B01D2255/20738B01J29/7815B01J29/18C10G11/05
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Quick Facts
Patent No.
US 8,865,121
App. No.
12/486,983
Granted
Oct 21, 2014
Kind
B2
Abstract

The present invention relates to an organotemplate-free synthetic process for the production of a zeolitic material having a BEA framework structure comprising YO 2 and optionally comprising X 2 O 3 , wherein said process comprises the steps of (1) preparing a mixture comprising seed crystals and at least one source for YO 2 ; and (2) crystallizing the mixture; wherein Y is a tetravalent element, and X is a trivalent element, wherein the zeolitic material optionally comprises at least one alkali metal M, wherein when the BEA framework additionally comprises X 2 O 3 ; the mixture according to step (1) comprises at least one source for X 2 O 3 , and wherein the seed crystals comprise zeolitic material having a BEA framework structure, preferably zeolite Beta.

Claims (44)

1. An organotemplate-free zeolitic material having a BEA framework structure obtained by an organotemplate-free synthetic process, having an X-ray diffraction pattern comprising at least the following reflections:

Intensity (%)

Diffraction angle 2θ/° [Cu K(alpha 1)]

[12-32]

[21.07-21.27]

100

[22.12-22.32]

[14-34]

[25.01-25.21]

[12-32]

[26.78-26.98]

[14-34]

[28.39-28.59]

[28-48]

[29.24-29.44)

[10-30]

[30.00-30.20]

[11-31]

[32.86-33.26]

[13-33]

[42.90-43.30]

wherein 100% relates to the intensity of the maximum peak in the X-ray powder diffraction pattern,

wherein the BEA framework structure comprises YO 2 and optionally comprises X 2 O 3 ,

wherein Y is a tetravalent element, and X is a trivalent element,

wherein the zeolitic material optionally comprises at least one alkali metal M, and

wherein said process comprises

(1) preparing a mixture comprising seed crystals and at least one source for YO 2 ; and

(2) crystallizing the mixture,

wherein Y is a tetravalent element, and X is a trivalent element,

wherein the zeolitic material optionally comprises at least one alkali metal M,

wherein when the BEA framework additionally comprises X 2 O 3 , the mixture according to (1) comprises at least one source for X 2 O 3 , and

wherein the seed crystals comprise zeolitic material having a BEA framework structure.

2. The organotemplate-free zeolitic material according to claim 1 , wherein the X-ray diffraction pattern comprises the following reflection:

Intensity (%)

Diffraction angle 2θ/° [Cu K(alpha 1)]

[11-31]

[25.53-25.73]

3. The organotemplate-free zeolitic material according to claim 1 , wherein the YO 2 :X 2 O 3 molar ratio ranges from 3 to 20.

4. The organotemplate-free zeolitic material according to claim 1 , wherein the molar ratio of alkali metal M:X 2 O 3 ranges from 1 to 5.

5. The organotemplate-free zeolitic material according to claim 1 , wherein Y is Si.

6. The organotemplate-free zeolitic material according to claim 1 , wherein X is Al.

7. The organotemplate-free zeolitic material according to claim 1 , wherein said material comprises sodium.

8. The organotemplate-free zeolitic material according to claim 1 , wherein the BET surface area of the zeolitic material determined according to DIN 66135 ranges from 400 to 650 m 2 /g.

9. The organotemplate-free zeolitic material according to claim 1 , wherein said material comprises zeolite Beta.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 31, 2009
From: XIAO, FENG-SHOU; XIE, BIN; MUELLER, ULRICH; YILMAZ, BILGE
To: BASF SE
Reel/Frame 023724/0187 →
Continuity (1)
Related Publication 20100322847A1 · Dec 23, 2010