IP Library Granted Patent US 8,890,300
Granted Patent B2
US 8,890,300 · App. 13/787,787 · Granted Nov 18, 2014

Discrete three-dimensional memory comprising off-die read/write-voltage generator

Inventor: Guobiao Zhang (Corvallis, OR)
Assignees: ChengDu HaiCun IP Technology LLC; Guobiao Zhang
G11C13/0021G11C5/145H01L2224/32145H01L2225/0651H01L2224/48227H01L2225/06562G11C13/004H01L2224/32225H01L2225/06506H01L2225/1064H01L2225/1023H01L25/105G11C8/14H01L2224/73265H01L2224/48145H01L25/0657G11C13/0069G11C5/02
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,890,300
App. No.
13/787,787
Granted
Nov 18, 2014
Kind
B2
Abstract

The present invention discloses a discrete three-dimensional memory (3D-M). Its 3D-M arrays are located on at least one 3D-array die, while its read/write-voltage generator (V R /V W -generator) is located on a separate peripheral-circuit die. The V R /V W -generator generates at least a read and/or write voltage to the 3D-array die. A single V R /V W -generator die can support multiple 3D-array dies.

Claims (29)

1. A discrete three-dimensional memory (3D-M), comprising:

a 3D-array die comprising at least a 3D-M array including a plurality of vertically stacked memory levels;

a peripheral-circuit die comprising at least a portion of a read/write-voltage generator for providing said 3D-array die with at least a read voltage and/or a write voltage other than the voltage supply;

wherein said portion of said read/write-voltage generator is absent from said 3D-array die; said peripheral-circuit die comprises fewer back-end layers than said 3D-array die, and said 3D-array die and said peripheral-circuit die are separate dice.

2. The discrete 3D-M according to claim 1 , wherein said 3D-M comprises a three-dimensional read-only memory (3D-ROM) or a three-dimensional random-access memory (3D-RAM).

3. The discrete 3D-M according to claim 1 , wherein said 3D-M comprises at least one of a memristor, a resistive random-access memory (RRAM or ReRAM), a phase-change memory, a programmable metallization cell (PMC), and a conductive-bridging random-access memory (CBRAM).

4. The discrete 3D-M according to claim 1 , wherein said read/write-voltage generator comprises a step-up whose output voltage is higher than the voltage supply.

5. The discrete 3D-M according to claim 4 , wherein said step-up comprises at least one of a charge pump and a boost converter.

6. The discrete 3D-M according to claim 1 , wherein said read/write-voltage generator comprises a step-down whose output voltage is lower than the voltage supply.

7. The discrete 3D-M according to claim 6 , wherein said step-down comprises at least one of a low dropout and a buck converter.

8. The discrete 3D-M according to claim 1 , further comprising another 3D-M die, wherein said peripheral-circuit die further comprises at least another portion of another read/write-voltage generator for said another 3D-M die, and said another portion of said another read/write-voltage generator is absent from said another 3D-M die.

9. The discrete 3D-M according to claim 1 , wherein said 3D-array die and said peripheral-circuit die are located in a memory package, a memory module, a memory card or a solid-state drive.

10. The discrete 3D-M according to claim 1 , wherein the array efficiency of said 3D-array die is larger than 40%.

11. A discrete three-dimensional memory (3D-M), comprising:

a 3D-array die comprising at least a 3D-M array including a plurality of vertically stacked memory levels;

a peripheral-circuit die comprising at least a portion of a read/write-voltage generator for providing said 3D-array die with at least a read voltage and/or a write voltage other than the voltage supply;

wherein said portion of said read/write-voltage generator is absent from said 3D-array die; said peripheral-circuit die comprises different interconnect materials than said 3D-array die, and said 3D-array die and said peripheral-circuit die are separate dice.

12. The discrete 3D-M according to claim 11 , wherein 3D-array die comprises high-temperature interconnect materials.

13. The discrete 3D-M according to claim 11 , wherein peripheral-circuit die comprises high-speed interconnect materials.

14. The discrete 3D-M according to claim 11 , wherein said 3D-M comprises a three-dimensional read-only memory (3D-ROM) or a three-dimensional random-access memory (3D-RAM).

15. The discrete 3D-M according to claim 11 , further comprising another 3D-M die, wherein said peripheral-circuit die further comprises at least another portion of another read/write-voltage generator for said another 3D-M die, and said another portion of said another read/write-voltage generator is absent from said another 3D-M die.

16. The discrete 3D-M according to claim 11 , wherein the array efficiency of said 3D-array die is larger than 40%.

17. A discrete three-dimensional memory (3D-M), comprising:

a 3D-array die comprising at least a 3D-M array including a plurality of vertically stacked memory levels;

a peripheral-circuit die comprising at least a portion of a read/write-voltage generator for providing said 3D-array die with at least a read voltage and/or a write voltage other than the voltage supply;

wherein said portion of said read/write-voltage generator is absent from said 3D-array die; said peripheral-circuit die comprises more substrate interconnect layers than said 3D-array die, and said 3D-array die and said peripheral-circuit die are separate dice.

18. The discrete 3D-M according to claim 17 , wherein said 3D-M comprises a three-dimensional read-only memory (3D-ROM) or a three-dimensional random-access memory (3D-RAM).

19. The discrete 3D-M according to claim 17 , further comprising another 3D-M die, wherein said peripheral-circuit die further comprises at least another portion of another read/write-voltage generator for said another 3D-M die, and said another portion of said another read/write-voltage generator is absent from said another 3D-M die.

20. The discrete 3D-M according to claim 17 , wherein the array efficiency of said 3D-array die is larger than 40%.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 23, 2025
From: ZHANG, GUOBIAO, DR.
To: CHENGDU HAICUN IP TECHNOLOGY LLC
Reel/Frame 070916/0986 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 16, 2014
From: ZHANG, GUOBIAO
To: CHENGDU HAICUN IP TECHNOLOGY LLC
Reel/Frame 033752/0270 →
Continuity (3)
Continuation In Part 13591257 · Aug 22, 2012
Provisional Application 61529929 · Sep 1, 2011
Related Publication 20130188415A1 · Jul 25, 2013