IP Library › Granted Patent US 8,900,991
Granted Patent B2
US 8,900,991 · App. 13/402,385 · Granted Dec 2, 2014

Film forming method and storage medium

Inventors: Shuji Azumo (Nirasaki, JP); Yasuhiko Kojima (Nirasaki, JP)
Assignee: Tokyo Electron Limited
H01L21/28556H01L21/76846C23C16/16C23C16/4488H01L21/76873H01L23/53238H01L21/76843
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Quick Facts
Patent No.
US 8,900,991
App. No.
13/402,385
Granted
Dec 2, 2014
Kind
B2
Abstract

In a film forming method for forming a Co film on a substrate provided in a processing chamber, gaseous Co 4 (CO) 12 as a single film forming material is supplied into the processing chamber. Then, the gaseous Co 4 (CO) 12 is thermally decomposed on the substrate to form the Co film on the substrate.

Claims (10)

1. A film forming method comprising:

providing a substrate in a processing chamber;

supplying gaseous Co 4 (CO) 12 as a single film forming material into the processing chamber; and

thermally decomposing the gaseous Co 4 (CO) 12 on the substrate to form a Co film on the substrate, and

wherein Co 2 (CO) 8 is used as a solid film forming material, the solid Co 2 (CO) 8 is vaporized to be a gaseous Co 2 (CO) 8 by heating at a temperature lower than a decomposition start temperature of the Co 2 (CO) 8 , the gaseous Co 2 (CO) 8 is changed into the gaseous Co 4 (CO) 12 by heating at a temperature at which the gaseous Co 4 (CO) 12 stably exists, and the gaseous Co 4 (CO) 12 is supplied into the processing chamber.

2. The film forming method of claim 1 , wherein the solid Co 2 (CO) 8 is vaporized by heating at a temperature lower than about 45° C.

3. The film forming method of claim 1 , wherein the gaseous Co 2 (CO) 8 is changed into the gaseous Co 4 (CO) 12 by heating at a temperature in a range from about 100° C. to 120° C.

4. The film forming method of claim 2 , wherein the gaseous Co 2 (CO) 8 is changed into the gaseous Co 4 (CO) 12 by heating at a temperature in a range from about 100° C. to 120° C.

5. The film forming method of claim 1 , wherein the heating temperature of the substrate is set to be in a range from about 120° C. to 300° C.

6. The film forming method of claim 1 , wherein after the Co film is formed, Cu is deposited thereon by electroplating.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 22, 2012
From: AZUMO, SHUJI; KOJIMA, YASUHIKO
To: TOKYO ELECTRON LIMITED
Reel/Frame 027744/0723 →
Priority Claims (1)
JP 2011-038774 · Feb 24, 2011 · national
Continuity (1)
Related Publication 20120220121A1 · Aug 30, 2012