Array test device, method for testing an organic light emitting display device, and method for manufacturing the organic light emitting display device
A method for testing an array for a pixel circuit of an organic light emitting diode display, which includes a first transistor that transmits a driving current corresponding to a data signal to an organic light emitting diode according to a scan signal and at least one capacitor, uses an array test device having a control device and a driver. The method includes performing a first irradiation of electron beams to an exposed portion of a first electrode of the at least one capacitor before manufacturing of the organic light emitting diode is completed, calibrating the control device of the array test device based on secondary electrons output by the at least one capacitor, performing a second irradiation of electron beams to an anode of the pixel circuit, and detecting whether the first transistor is normally operated based on an output amount of secondary electrons output by the anode.
1. A device for testing an array of an organic light emitting diode display, the device comprising:
an electron beam irradiator that irradiates first electron beams to a capacitor of a selected pixel from a pixel array, which pixel array includes a plurality of pixels that each include an anode, a driving transistor that transmits a driving current that corresponds to a data signal of an organic light emitting diode according to a scan signal, and at least one capacitor, and that irradiates second electron beams to respective anodes of the plurality of pixels;
a signal analyzer that detects a first output amount of secondary electrons that are output corresponding to the irradiation of the first electron beams, that detects a second output amount of secondary electrons that are output corresponding to the irradiation of the second electron beams, and that calculates a first detected voltage that corresponds to the first output amount and a second detected voltage that corresponds to the second output amount;
a controller that sets a charging voltage charged into the capacitor, that sets an irradiation amount of the first electron beams, and an irradiation amount of the second electron beams, that compares the first detected voltage and the charging voltage, and that determines an operational state of the pixel array based on the second detected voltage; and
a calibrator that performs a calibration process when the first detected voltage and the charging voltage are determined to digress from a predetermined threshold range and are in a non-corresponding relationship with respect to each other.
2. The device as claimed in claim 1 , further comprising:
an electron beam output means for irradiating the first electron beams and the second electron beams,
an electron detecting means for detecting the secondary electrons that are output corresponding to the irradiation of the first electron beams and to the irradiation of the second electron beams, and
a driver driven with a gap from the pixel array.
3. The device as claimed in claim 1 , wherein the controller presets a voltage supplied to at least one signal line for connecting the plurality of pixels and sets the charging voltage of the capacitor to be a predetermined reference voltage.
4. The device as claimed in claim 1 , wherein:
the controller compares the second detected voltage and an input voltage applied to the anode of each of the plurality of pixels during the irradiation of the second electron beams, and
the controller tracks an address of a pixel circuit digressing from a predetermined threshold range to determine a pixel corresponding to the pixel circuit digressing from the predetermined threshold range to be an abnormal pixel.
5. The device as claimed in claim 1 , wherein the at least one capacitor of the each pixel is one of a plurality of capacitors, and the pixel further includes:
a first transistor that transmits the data signal to a gate electrode of the driving transistor according to the scan signal;
a second transistor connected to the gate electrode and a drain electrode of the driving transistor, the second transistor compensating a threshold voltage of the driving transistor according to a first control signal;
a third transistor that transmits the data signal to the gate electrode of the driving transistor according to the first control signal;
a first capacitor of the plurality of capacitors that stores a data voltage corresponding to the data signal applied to the gate electrode of the driving transistor;
a second capacitor of the plurality of capacitors that stores a compensating voltage for compensating the threshold voltage of the driving transistor; and
a third capacitor of the plurality of capacitors that maintains a gate electrode voltage of the third transistor, the first electron beams being irradiated to one of the first, second, and third capacitors.
6. The device as claimed in claim 5 , wherein the pixel further includes a fourth transistor that is connected between a drain electrode of the first transistor and the gate electrode of the driving transistor, and that transmits the data signal transmitted by the first transistor to the gate electrode of the driving transistor according to a second control signal.