Latency measurement
Panning latency measurement techniques are described. In one or more implementations, a test apparatus includes one or more motors configured to move one or more contacts at least proximal to one or more sensors of a device to be detectable as a movement. The test apparatus also includes one or more modules implemented at least partially in hardware to measure latency of the device to recognize the movement of the one or more contacts.
1. A test apparatus comprising:
one or more motors configured to move one or more contacts at least proximal to one or more sensors of a device to be detectable as movement; and
one or more modules implemented at least partially in hardware to measure latency of the device to recognize the movement of the one or more contacts.
2. A test apparatus as described in claim 1 , wherein the one or more modules are configured to measure the latency as hardware latency of the device in recognizing the movement.
3. A test apparatus as described in claim 1 , wherein the one or more modules are configured to measure the latency as end-to-end latency of the device in recognizing the movement.
4. A test apparatus as described in claim 1 , wherein the one or more motors are configured as a step motor.
5. A test apparatus as described in claim 4 , wherein the step motor is configured to move the one or more contacts to form a circular path, at least a portion of which is detectable by the one or more sensors of the device.
6. A test apparatus as described in claim 1 , wherein the one or more modules are configured to measure the latency of the device in recognizing the movement through use of constant angular velocity.
7. A test apparatus as described in claim 1 , wherein the one or more sensors of the device are configured to detect the one or more contacts as at least proximal through configuration as a touch sensor, infrared sensor, optical imaging sensor, dispersive signal sensor, sensor in pixel, resistive sensor, or acoustic pulse recognition sensor.
8. A test apparatus as described in claim 1 , wherein the one or more modules include an interruption module having a photo interrupter circuit configured to detect position of the one or more contacts, which is used at least in part to measure the latency.
9. A test apparatus as described in claim 8 , wherein the interruption module is configured to detect when the one or more contacts passes a control point to determine an angle of rotation for the contact by the one or more motors.
10. A test apparatus as described in claim 1 , further comprising a laser and a photo diode that is configured to detect when the one or more contacts passes between the laser and the photo diode, which is used at least in part to measure the latency.
11. A method comprising:
moving one or more contacts, by one or more motors, at least proximal to one or more sensors of a device to be detectable as movement; and
measuring latency of the device to recognize the movement of the one or more contacts by one or more modules implemented at least partially in hardware.
12. A method as described in claim 11 , wherein the one or more motors are configured as a step motor.
13. A method as described in claim 12 , wherein the step motor is configured to move the one or more contacts to form a circular path, at least a portion of which is detectable by the one or more sensors of the device.
14. A method as described in claim 11 , wherein the one or more modules include an interruption module having a photo interrupter circuit configured to detect position of the one or more contacts, which is used at least in part to measure the latency.
15. A method as described in claim 14 , wherein the interruption module is configured to detect when the one or more contacts passes a control point to determine an angle of rotation for the contact by the one or more motors.
16. A method as described in claim 11 , wherein the one or more modules are configured to measure the latency as hardware latency of the device in recognizing the movement.
17. A method as described in claim 11 , wherein the one or more modules are configured to measure the latency as end-to-end latency of the device in recognizing the movement.
18. A method as described in claim 11 , wherein the one or more modules are configured to measure the latency of the device in recognizing the movement through use of constant angular velocity.
19. A method as described in claim 11 , wherein the one or more sensors of the device are configured to detect the one or more contacts as at least proximal through configuration as a touch sensor, infrared sensor, optical imaging sensor, dispersive signal sensor, sensor in pixel, resistive sensor, or acoustic pulse recognition sensor.
20. A method as described in claim 11 , further comprising a laser and a photo diode that is configured to detect when the one or more contacts passes between the laser and the photo diode, which is used at least in part to measure the latency.