Incoherent transmission electron microscopy
A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope may be adapted to generate two or more images that are substantially incoherently related to one another, store the images, and combine amplitude signals at corresponding pixels of the respective images to improve a signal-to-noise ratio. Alternatively or in addition, the transmission electron microscope may be adapted to operate the specimen holder to move the specimen in relation to the beam optics during exposure or between exposures to operate the transmission electron microscope in an incoherent mode.
1. A transmission electron microscope comprising:
an electron beam source to generate an electron beam;
beam optics to converge the electron beam;
a specimen holder to hold a specimen in the path of the electron beam; and
a detector to detect the electron beam transmitted through the specimen,
wherein the transmission electron microscope is adapted to generate two or more images that are substantially incoherently related to one another, store the images, and combine amplitude signals at corresponding pixels of the respective images to improve a signal-to-noise ratio.
2. The transmission electron microscope of claim 1 , wherein the transmission electron microscope is adapted to consume less than about 800 W of power.
3. A method of generating an image of a specimen, the method comprising:
generating an electron beam;
converging the electron beam;
holding a specimen in the path of the electron beam;
detecting the electron beam transmitted through the specimen to generate two or more images that are substantially incoherently related to one another;
storing the two or more images; and
combining amplitude signals at corresponding pixels of the respective images to improve a signal-to-noise ratio.
4. The method of claim 3 , wherein the method consumes less than about 800 W.
5. A transmission electron microscope comprising:
an electron beam source to generate an electron beam;
beam optics to converge the electron beam;
a specimen holder to hold a specimen in the path of the electron beam; and
a detector to detect the electron beam transmitted through the specimen,
wherein the transmission electron microscope is adapted to operate the specimen holder to move the specimen between two or more exposure times that correspond to a single image to improve a signal-to-noise ratio in an incoherent mode.
6. The transmission electron microscope of claim 5 , wherein the transmission electron microscope is adapted to operate the specimen holder to move the specimen during exposure for a single image to improve a signal-to-noise ratio.
7. The transmission electron microscope of claim 5 , wherein the transmission electron microscope is adapted to operate the specimen holder to move the specimen between two or more exposure times that correspond to separate images that are to be combined to improve a signal-to-noise ratio.
8. The transmission electron microscope of claim 5 , wherein the transmission electron microscope is adapted to have a power consumption of less than about 800 W.