Calibration artefact for calibrating an articulating probe head
A method of calibrating an articulating probe head comprising the steps of measuring an artifact of known dimensions with the workpiece sensing probe mounted on the articulating probe head, in which the articulating probe head is unlocked. An error functional map is generated corresponding to the difference between the measured and known dimensions of the artifact. Subsequent workpieces are measured with the articulating probe head unlocked and the corresponding correction applied. The true dimensions of the artifact may be determined by measuring it with a probe mounted on an articulating probe head in which the axes of the articulating probe head are locked. A mechanical lock is provided to lock the axes of the articulating probe head.
1. A calibration artifact for calibrating an articulating probe head mounted on an arm of a coordinate positioning machine, the calibration artifact comprising:
a base for supporting the calibration artifact on a surface of the coordinate positioning machine; and
profiles of different dimensions that can be scanned by articulating the probe head relative to the arm of the coordinate positioning machine,
wherein the profiles are operatively coupled to the base to enable, when the base is supported on the surface of the coordinate positioning machine, changing of an orientation of the profiles about an axis that is not perpendicular to the surface.
2. The calibration artifact according to claim 1 , further comprising an indexing element configured to change the orientation of the profiles about the axis.
3. The calibration artifact according to claim 1 , wherein the profiles are operatively coupled to the base to enable changing of an orientation of the profiles about a further axis that is perpendicular to the axis.
4. The calibration artifact according to claim 3 , wherein, when the base is supported on the surface of the coordinate positioning machine, the further axis is perpendicular to the surface of the coordinate positioning machine.
5. The calibration artifact according to claim 4 , further comprising two indexing elements, wherein:
one of the indexing elements is configured to orient the profiles about the axis, and
the other of the indexing elements is configured to orient the profiles about the further axis.
6. The calibration artifact according to claim 3 , further comprising two indexing elements, wherein:
one of the indexing elements is configured to orient the profiles about the axis, and
the other of the indexing elements is configured to orient the profiles about the further axis.
7. The calibration artifact according to claim 1 , wherein:
each of the profiles has a circular shape centred along a common centre line, and
the profiles are operatively coupled to the base such that, when the base is supported on the surface of the coordinate positioning machine, the centre line can be rotated about the axis.
8. The calibration artifact according to claim 1 , further comprising a member having a surface that includes the profiles.
9. The calibration artifact according to claim 8 , wherein the surface is a stepped surface.
10. The calibration artifact according to claim 9 , further comprising a frame that supports the member,
wherein the member is coupled to the frame to allow relative movement between the frame and the member for orientating the profiles.
11. The calibration artifact according to claim 10 , wherein the frame is supported by the base to allow relative movement between the frame and the base for orientating the profiles.
12. The calibration artifact according to claim 8 , further comprising a frame that supports the member,
wherein the member is coupled to the frame to allow relative movement between the frame and the member for orientating the profiles.
13. The calibration artifact according to claim 12 , wherein the frame is supported by the base to allow relative movement between the frame and the base for orientating the profiles.