IP Library › Granted Patent US 8,970,844
Granted Patent B2
US 8,970,844 · App. 13/764,796 · Granted Mar 3, 2015

Signal amplifier by triple Mach-Zehnder interferometers

Inventors: Allen D. Parks (Spotsylvania, VA); Scott E. Spence (Fredericksburg, VA)
Assignee: The United States of America as Represented by the Secretary of the Navy
G02F1/21G06N99/002G01B2290/55
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Quick Facts
Patent No.
US 8,970,844
App. No.
13/764,796
Granted
Mar 3, 2015
Kind
B2
Abstract

A signal amplifier is provided via a triple Mach-Zehnder interferometer (MZI) apparatus for determining intensity distribution at either a first port or a second port by a photon from a source. The first and second ports correspond to respective first and second directions. The MZI apparatus includes four beam-splitters disposed co-linearly in parallel between the source and the ports, six parallel mirrors, and first and second path projectors. Three of these mirrors are displaced along the first direction from the beam-splitters, while the remaining mirrors are displaced along the second direction. The path projectors conduct weak measurement of a photon occupation number and are disposed between the second beam-splitter and an adjacent downstream mirror. The output port is disposed beyond the fourth beam-splitter in the first direction. The intensity distribution at the output port is positive in response to one of the first measurement being positive and the second measurement being negative.

Claims (15)

1. A signal amplifier via a triple Mach-Zehnder interferometer (MZI) apparatus for determining intensity distribution at an output port by a photon source, said MZI apparatus comprising:

first, second, third and fourth beam-splitters disposed co-linearly in parallel between the source and first and second ports;

first, second, third, fourth, fifth and sixth mirrors, said first, third and fifth mirrors disposed co-linearly in parallel and displaced from said beam-splitters along a first direction, said second, fourth and sixth mirrors disposed co-linearly in parallel and displaced from said beam-splitters along a second direction;

a first path projector for conducting a first weak measurement of a first photon occupation number, said first path projector being disposed between said second beam-splitter and said third mirror effectively responsive to displacing said third mirror away from said fourth mirror; and

a second path projector for conducting a second weak measurement of a second photon occupation number, said second path projector being disposed between said second beam-splitter and said fourth mirror effectively responsive to displacing said fourth mirror away from said third mirror, wherein

the output port is disposed beyond said fourth beam-splitter in said first direction, and

the intensity distribution at the output port is positive in response to one of said first measurement being positive and said second measurement being negative.

2. The MZI apparatus according to claim 1 , wherein at least one of said third and fourth mirrors is displaced laterally from said beam-splitters by a finite distance corresponding to measurement interaction strength.

3. The MZI apparatus according to claim 2 , wherein said finite distance is adjusted until said first and second photon occupation numbers produce detectably significant weak values.

4. The MZI apparatus according to claim 1 , further including:

a first phase shift window for determining a first phase angle, said first phase shift window being disposed between said first mirror and said second beam-splitter; and

a second phase shift window for determining a second phase angle, said second phase shift window being disposed between said fifth mirror and said fourth beam-splitter.

5. The MZI apparatus according to claim 4 , wherein said first phase angle equals one-half π plus a first difference angle and said second phase angle equals one-half π minus a second difference angle, with both difference angles being small and positive, such that

said first weak measurement of said first occupation number corresponds approximately to a reciprocal of a sum of said difference angles, and

said second weak measurement of said second occupation number corresponds approximately to a negative reciprocal of said sum.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 13, 2013
From: PARKS, ALLEN D.; SPENCE, SCOTT E.
To: UNITED STATES OF AMERICA, REP BY SEC OF NAVY
Reel/Frame 029825/0816 →
Continuity (2)
Continuation In Part 13199507 · Aug 24, 2011
Related Publication 20130155411A1 · Jun 20, 2013