IP Library › Granted Patent US 8,981,304
Granted Patent B2
US 8,981,304 · App. 12/974,707 · Granted Mar 17, 2015

Radiation detector

Inventor: Yoshihiro Okada (Kanagawa, JP)
Assignee: FUJIFILM Corporation
G01T1/243G01T1/2018
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Quick Facts
Patent No.
US 8,981,304
App. No.
12/974,707
Granted
Mar 17, 2015
Kind
B2
Abstract

The present invention provides a radiation detector including: a wavelength conversion unit that converts irradiated radiation to a radiation with a second wavelength; a first substrate that has a first and a second surface; radiation detecting pixels, disposed in a matrix on the first surface, that accumulate charges generated by irradiation of the radiation with the second wavelength, and that include switching elements to read out the charges; scan lines, provided on the first surface, through which a control signal, that switches each switching element provided in each radiation detecting pixel, flows; signal lines, provided on the first surface, through which an electric signal flows, the electric signal corresponding to the charges accumulated in each radiation detecting pixel; and a second substrate, provided on the second surface, that includes radiation irradiation detecting sensors that generate charges due to irradiation of the radiation having the second wavelength.

Claims (32)

1. A radiation detector, comprising:

a wavelength conversion unit that converts irradiated radiation having a first wavelength into radiation having a second wavelength, said second wavelength corresponding to light;

a first substrate that has a first surface and a second surface different from the first surface;

a plurality of radiation detecting pixels, disposed in a matrix on the first surface, that accumulate charges generated due to irradiation of the radiation having the second wavelength, and that include switching elements to read out the accumulated charges;

a plurality of scan lines, provided on the first surface, through which a control signal, that switches each switching element provided in each radiation detecting pixel, flows;

a plurality of signal lines, provided on the first surface, through which an electric signal flows, the electric signal corresponding to the charges accumulated in each radiation detecting pixel according to a switching state of each switching element;

a second substrate, provided on the second surface of the first substrate, that includes a plurality of radiation irradiation detecting sensors, disposed in a matrix on an entire surface of the second substrate, that generate charges due to irradiation of the radiation having the second wavelength corresponding to light being irradiated onto the first surface and emitted from the second surface;

radiation irradiation detecting lines, each connected to one of the radiation irradiation detecting sensors, through which electric signals corresponding to the charges generated by the radiation irradiation detecting sensors flow; and

a radiation irradiation control device, connected to each of the radiation irradiation detecting lines, that detects an irradiation amount of radiation having the first wavelength, and controls a radiation source to irradiate the radiation having the first wavelength on the basis of the detected irradiation amount.

2. The radiation detector of claim 1 , wherein the second substrate includes a resin substrate.

3. The radiation detector of claim 1 , wherein the radiation irradiation detecting sensors include an organic material.

4. The radiation detector of claim 1 , wherein the radiation irradiation detecting sensors include an inorganic material.

5. The radiation detector of claim 1 , wherein the wavelength conversion unit includes GOS.

6. The radiation detector of claim 1 , wherein the wavelength conversion unit includes CsI.

7. The radiation detector of claim 1 , wherein the radiation irradiation detecting sensors detect at least one of, start of irradiation of the radiation, completion of the irradiation of the radiation, and an amount of irradiated radiation.

8. The radiation detector of claim 1 , wherein the second substrate is positioned such that each detection region of the irradiation detecting sensor, provided on the second substrate, corresponds to each detection region of a pixel group formed by a number of the radiation detecting pixels, provided on the first substrate.

9. A radiation detector, comprising:

a wavelength conversion unit, having a first surface and a second surface, that converts irradiated radiation having a first wavelength into radiation having a second wavelength and that emits the radiation having the second wavelength from both surfaces, wherein said second wavelength corresponds to light;

a first substrate that is provided on the first surface of the wavelength conversion unit;

a plurality of radiation detecting pixels, disposed in a matrix on the first substrate, that accumulate charges generated due to irradiation of the radiation emitted from the first surface of the wavelength conversion unit and having the second wavelength, and that include switching elements to read out the accumulated charges;

a plurality of scan lines, provided on the first substrate, through which a control signal, that switches each switching element provided in each radiation detecting pixel, flows;

a plurality of signal lines, provided on the first substrate, through which an electric signal flows, the electric signal corresponding to the charges accumulated in each radiation detecting pixel according to a switching state of each switching element;

a second substrate, provided on the second surface of the wavelength conversion unit, that includes a plurality of radiation irradiation detecting sensors, disposed in a matrix on an entire surface of the second substrate, that generate charges due to irradiation of the radiation having the second wavelength corresponding to light emitted from the second surface of the wavelength conversion unit;

radiation irradiation detecting lines, each connected to one of the radiation irradiation detecting sensors, through which electric signals corresponding to the charges generated by the radiation irradiation detecting sensors flow; and

a radiation irradiation control device, connected to each of the radiation irradiation detecting lines, that detects an irradiation amount of radiation having the first wavelength, and controls a radiation source to irradiate the radiation having the first wavelength on the basis of the detected irradiation amount.

10. The radiation detector of claim 9 , wherein the second substrate includes a resin substrate.

11. The radiation detector of claim 9 , wherein the radiation irradiation detecting sensors include an organic material.

12. The radiation detector of claim 9 , wherein the radiation irradiation detecting sensors include an inorganic material.

13. The radiation detector of claim 9 , wherein the wavelength conversion unit includes GOS.

14. The radiation detector of claim 9 , wherein the wavelength conversion unit includes CsI.

15. The radiation detector of claim 9 , wherein the radiation irradiation detecting sensors detect at least one of, start of irradiation of the radiation, completion of the irradiation of the radiation, and an amount of irradiated radiation.

16. The radiation detector of claim 9 , wherein the second substrate is positioned such that each detection region of the irradiation detecting sensor, provided on the second substrate, corresponds to each detection region of a pixel group formed by a number of the radiation detecting pixels, provided on the first substrate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 21, 2010
From: OKADA, YOSHIHIRO
To: FUJIFILM CORPORATION
Reel/Frame 025533/0810 →
Priority Claims (1)
JP 2010-013484 · Jan 25, 2010 · national
Continuity (1)
Related Publication 20110180714A1 · Jul 28, 2011