On-chip service processor
An integrated circuit is described that includes a stored program processor for test and debug of user-definable logic plus external interface between the test/debug circuits and the component pins. The external interface may be via an existing test interface or a separate serial or parallel port. Test and debug circuits may contain scan strings that may be used to observe states in user-definable logic or be used to provide pseudo-random bit sequences to user-definable logic. Test and debug circuits may also contain an on-chip logic analyzer for capturing sequences of logic states in user-definable circuits. Test and debug circuits may be designed to observe states in user-definable circuits during the normal system operation of said user-definable circuits.
1. An integrated circuit comprising:
one or more logic blocks configured to generate one or more system operation signals at one or more system operation clock rates;
a service processor unit configured to perform one or more debug operations on one or more of the logic blocks, the service processor unit comprising:
a control unit configured to control the service processor unit;
a memory;
an analysis engine; and
a bus interface; and
a multiplicity of probe lines configured to capture and propagate one or more of the one or more system operation signals from the logic blocks to the service processor unit.
2. The integrated circuit of claim 1 , wherein the analysis engine is configured to align signals received from the probe lines.
3. The integrated circuit of claim 1 , wherein the analysis engine includes a variable first-in, first-out (FIFO) element.
4. The integrated circuit of claim 1 , wherein the analysis engine is configured to store aligned signals in buffer memory.
5. The integrated circuit of claim 1 , wherein the service processor unit further comprises a parallel I/O port, wherein data and instructions are sent through the parallel I/O port to the service processor unit from an external console, and wherein result data is provided through the parallel I/O port to the external console.
6. The integrated circuit of claim 1 , wherein the service processor unit further comprises a serial I/O port, wherein data and instructions are sent through the serial I/O port to the service processor unit from an external console, and wherein result data is provided through the serial I/O port to the external console.
7. The integrated circuit of claim 1 , wherein the service processor unit further comprises a JTAG port, wherein data and instructions are sent through the JTAG port to the service processor unit from an external console, and wherein result data is provided through the JTAG port to the external console.
8. The integrated circuit of claim 1 , wherein the multiplicity of probe lines includes at least one analog probe line.
9. The integrated circuit of claim 1 , wherein the multiplicity of probe lines includes at least one digital probe line.
10. The integrated circuit of claim 9 , wherein the digital probe line comprises at least one storage element and is configured to move one or more of the system operation signals from one or more of the logic blocks to the service processor unit via the bus interface.
11. The integrated circuit of claim 10 , wherein the at least one storage element is configured to use a system clock to move the one or more of the system operation signals.
12. The integrated circuit of claim 1 , wherein the control unit is configured to execute instructions for providing test signals to one or more of the logic blocks and for retrieving one or more test signal results from one or more of the logic blocks.
13. The integrated circuit of claim 1 , wherein the bus interface is a test bus interface.
14. The integrated circuit of claim 1 , further comprising:
a test access port controller.
15. An integrated circuit comprising:
a multiplicity of logic blocks configured to generate one or more system operation signals;
a logic analyzer coupled to at least one external interface; and
a multiplicity of probe lines configured to propagate signals to the logic analyzer, wherein at least one of the probe lines is configured to propagate at least one of the system operation signals, and wherein the logic analyzer is configured to:
store a selected set of the system operation signals for retrieval through the at least one external interface; and
align the selected set of system operation signals.
16. The integrated circuit of claim 15 , wherein the logic analyzer includes a variable first-in, first-out (FIFO) element.
17. The integrated circuit of claim 15 , wherein at least one of the probe lines is configured to propagate at least one signal representing at least one analog event.
18. The integrated circuit of claim 17 , wherein the at least one analog event comprises a ground bounce event.
19. The integrated circuit of claim 15 , further comprising an analog-event detection circuit, wherein at least one of the probe lines is configured to propagate one or more signals from the analog-event detection circuit.
20. The integrated circuit of claim 19 , wherein the analog-event detection circuit is configured to detect a voltage level.
21. The integrated circuit of claim 15 , wherein the multiplicity of probe lines includes at least one digital probe line.
22. An integrated circuit comprising:
one or more logic blocks configured to generate one or more system operation signals at one or more system operation clock rates;
a service processor unit configured to perform one or more debug operations on one or more of the logic blocks, the service processor unit comprising:
a control unit;
a memory;
an analysis engine; and
a bus interface; and
a multiplicity of probe lines configured to capture one or more of the one or more system operation signals from the logic blocks to the service processor unit, wherein the analysis engine is configured to align signals received from the probe lines.