IP Library › Granted Patent US 9,017,831
Granted Patent B2
US 9,017,831 · App. 13/779,048 · Granted Apr 28, 2015

Thin-film magnetic oscillation element

Inventors: Katsuyuki Nakada (Tokyo, JP); Takahiro Suwa (Tokyo, JP); Kuniyasu Ito (Tokyo, JP); Yuji Kakinuma (Tokyo, JP); Masato Takahashi (Tokyo, JP)
Assignee: TDK Corporation
H01F1/0036G11C11/16G01R33/091G11B5/3903G01R33/093H01F10/3268
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Quick Facts
Patent No.
US 9,017,831
App. No.
13/779,048
Granted
Apr 28, 2015
Kind
B2
Abstract

A thin-film magnetic oscillation element includes a pinned magnetic layer, a free magnetic layer, a nonmagnetic spacer layer provided between the pinned magnetic layer and the free magnetic layer, and a pair of electrodes, in which the easy axis of magnetization of the pinned magnetic layer lies in an in-plane direction of the plane of the pinned magnetic layer, and the easy axis of magnetization of the free magnetic layer lies in a direction normal to the plane of the free magnetic layer. Preferably, the relationship between the saturation magnetization Ms and the magnetic anisotropy field Ha of the free magnetic layer satisfies 1.257 Ms<Ha<12.57 Ms. More preferably, the free magnetic layer is composed of an alloy or a stacked film containing at least one element selected from Co, Ni, Fe, and B.

Claims (11)

1. A thin-film magnetic oscillation element comprising:

a pinned magnetic layer;

a free magnetic layer;

a nonmagnetic spacer layer provided between the pinned magnetic layer and the free magnetic layer; and

a pair of electrodes,

wherein

an easy axis of magnetization of the pinned magnetic layer is in an in-plane direction of a plane of the pinned magnetic layer,

an easy axis of magnetization of the free magnetic layer is in a direction normal to a plane of the free magnetic layer, and

a relationship between a saturation magnetization Ms and a magnetic anisotropy field Ha of the free magnetic layer satisfies 1.333Ms≦Ha≦12.628Ms.

2. The thin-film magnetic oscillation element according to claim 1 , wherein the free magnetic layer is composed of an alloy or a stacked film containing at least one element selected from Co, Ni, Fe, and B.

3. The thin-film magnetic oscillation element according to claim 1 , wherein the free magnetic layer has a plurality of stacked structures each selected from CoFe/Ni, Co/NiFe, and CoFe/NiFe.

Assignments (2)
CHANGE OF ADDRESS Recorded Oct 8, 2013
From: TDK CORPORATION
To: TDK CORPORATION
Reel/Frame 031422/0755 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 27, 2013
From: NAKADA, KATSUYUKI; SUWA, TAKAHIRO; ITO, KUNIYASU; KAKINUMA, YUJI; TAKAHASHI, MASATO
To: TDK CORPORATION
Reel/Frame 030582/0915 →
Priority Claims (1)
JP 2012-044093 · Feb 29, 2012 · national
Continuity (1)
Related Publication 20130222092A1 · Aug 29, 2013