Pixel and array test method for the same
A pixel includes an organic light emitting diode, a first transistor that is connected to a first power source and that supplies a driving current according to a corresponding data voltage to the organic light emitting diode, a second transistor that is connected to a scan line and that transmits the corresponding data voltage from a data line to a driving transistor according to a scan signal transmitted from the scan line, and a first capacitor including one electrode connected to a gate electrode of the first transistor. The first capacitor stores the corresponding data voltage as a first voltage and a size of the first capacitor is in a range of about 2 times to about 4 times a size of a gate insulating layer of the first transistor.
1. A method of testing a pixel array for a pixel including a driving transistor to control a supply of a driving current to an organic light emitting diode according to a scan signal and a storage capacitor connected to the driving transistor, the method comprising:
receiving the pixel array including the pixel;
irradiating an electron beam to an anode of the organic light emitting diode before completing manufacture of the organic light emitting diode; and
testing an inferiority existence of the storage capacitor based on a detection amount of secondary electrons emitted from the anode, wherein testing the inferiority existence of the storage capacitor includes determining a ratio of a normal voltage to an abnormal voltage based on the detection amount of the secondary electrons, and wherein a ratio of a size of a capacitance of the storage capacitor to a size of capacitance of a gate insulating layer of the driving transistor is manufactured to be in a predetermined range for detection of a defective state of the storage capacitor.
2. The method of claim 1 , wherein the gate insulating layer of the driving transistor is arranged between an active layer and a gate metal layer of the driving transistor.
3. The method of claim 1 , wherein the size of the capacitance of the storage capacitor is about 2 times to about 4 times the size of the capacitance of the gate insulating layer of the driving transistor.
4. The method of claim 1 , wherein irradiating the electron beam to the anode of the organic light emitting diode is performed before an light emitting layer is coupled to the anode.
5. A method of testing a pixel, the method comprising:
receiving a pixel array including the pixel;
irradiating an electron beam to an anode of an organic light emitting diode of the pixel before completing manufacture of the organic light emitting diode; and
testing an inferiority existence of a storage capacitor of the pixel based on a detection amount of secondary electrons emitted from the anode, a size of a capacitance of the storage capacitor to a size of capacitance of a gate insulating layer of a driving transistor coupled to the storage capacitor is manufactured to be in a predetermined range for detection of a defective state of the storage capacitor, wherein the testing of the inferiority existence of the storage capacitor includes determining a ratio of a normal voltage to an abnormal voltage based on the detection amount of the secondary electrons, the ratio being a function of the capacitances of the storage capacitor and the gate insulating layer.
6. The method of claim 5 , wherein
the storage capacitor and the gate insulating layer are coupled in series, and
the ratio of the normal voltage to the abnormal voltage based on the detection amount of the secondary electrons is C 1 /(C 1 +C 2 ), C 1 being the capacitance of the storage capacitor and C 2 being the capacitance of the gate insulating layer.
7. The method of claim 5 , wherein the capacitance of the storage capacitor is about 2 times to about 4 times the capacitance of the gate insulating layer.
8. A method for testing a pixel, the method comprising:
irradiating a beam onto an electrode of an organic light emitting diode of the pixel before completing manufacture of the organic light emitting diode;
determining a ratio of a normal voltage to an abnormal voltage based on a detection amount of secondary electrons produced by the beam; and
testing existence of an inferiority of a storage capacitor of the pixel based on the ratio of the normal and abnormal voltages, wherein the ratio is a function of a capacitance of the storage capacitor and a capacitance of a gate insulating layer of a driving transistor of the pixel.
9. The method of claim 8 , wherein:
the storage capacitor and the gate insulating layer are coupled in series, and
the ratio of the normal voltage to the abnormal voltage based on the detection amount of the secondary electrons is a function of C 1 /(C 1 +C 2 ), where C 1 is the capacitance of the storage capacitor and C 2 is the capacitance of the gate insulating layer.
10. The method of claim 8 , wherein the capacitance of the storage capacitor is about 2 times to about 4 times the capacitance of the gate insulating layer.