IP Library Granted Patent US 9,023,306
Granted Patent B2
US 9,023,306 · App. 12/435,565 · Granted May 5, 2015

Ultratough single crystal boron-doped diamond

Inventors: Russell J. Hemley (Washington, DC); Ho-Kwang Mao (Washington, DC); Chih-Shiue Yan (Washington, DC); Qi Liang (Washington, DC)
Assignee: Carnegie Institution of Washington
C23C16/278C30B25/165C30B23/00C30B25/16C30B25/00C23C16/274C30B25/105C30B29/04
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Quick Facts
Patent No.
US 9,023,306
App. No.
12/435,565
Granted
May 5, 2015
Kind
B2
Abstract

The invention relates to a single crystal boron doped CVD diamond that has a toughness of at least about 22 MPa m 1/2 . The invention further relates to a method of manufacturing single crystal boron doped CVD diamond. The growth rate of the diamond can be from about 20-100 μm/h.

Claims (21)

1. A method for growing single-crystal boron doped diamond of high toughness comprising:

i) placing a seed diamond in a heat sink holder made of a material that has a high melting point and high thermal conductivity to minimize temperature gradients across the growth surface of the diamond;

ii) controlling the temperature of a growth surface of the diamond such that the temperature of the growing diamond crystals is in the range of 1100-1300° C.; and

iii) growing single-crystal diamond by microwave plasma chemical vapor deposition on the growth surface of a diamond in a deposition chamber comprising 5-20% CH 4 /H 2 , 5-20% O 2 /CH 4 , 0-0.2% N 2 /CH 4 and a source of boron,

wherein the growth rate of the diamond is from about 20-100 μm/h,

wherein the orientation of the single-crystal diamond seed is 1-15 degrees off of the {100} plane,

wherein the as-grown diamond is substantially free of silicon in the diamond structure,

wherein the pressure in the deposition chamber is from 150 to 220 torr; and

wherein the toughness of the as-grown diamond is in the range of 22-35 MPa m 1/2 .

2. The method of claim 1 , wherein the source of boron is diborane, hexagonal boron nitride powder, a trimethyl borate gas, vaporized B 2 O 3 , or mixtures thereof.

3. The method of claim 1 , further comprising annealing the single-crystal diamond.

4. The method of claim 1 , wherein the heat sink holder is made of molybdenum.

5. The method of claim 1 , wherein the source of O 2 is carbon monoxide, carbon dioxide, water vapor or mixtures thereof.

6. A single-crystal boron-doped diamond grown by microwave plasma chemical vapor deposition that has a toughness in the range of 22-35 MPa m 1/2 and is grown by a method comprising:

i) placing a seed diamond in a heat sink holder made of a material that has a high melting point and high thermal conductivity to minimize temperature gradients across the growth surface of the diamond;

ii) controlling the temperature of a growth surface of the diamond such that the temperature of the growing diamond crystals is in the range of about 1100-1300 ° C.; and

iii) growing single-crystal diamond by microwave plasma chemical vapor deposition on the growth surface of a diamond in a deposition chamber comprising 5-20% CH 4 /H 2 , 5-20% O 2 /CH 4 , 0-0.2% N 2 /CH 4 and a source of boron,

wherein the growth rate of the diamond is from about 20-100 μm/h,

wherein the orientation of the single-crystal diamond seed is 1-15 degrees off of the {100} plane,

wherein the pressure in the deposition chamber is from 150 to 220 torr; and

and wherein the as-grown diamond is substantially free of silicon in the diamond structure.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 4, 2009
From: HEMLEY, RUSSELL J.; MAO, HO-KWANG; YAN, CHIH-SHIUE; LIANG, QI
To: CARNEGIE INSTITUTION OF WASHINGTON
Reel/Frame 022778/0011 →
Continuity (2)
Provisional Application 60071524 · May 5, 2008
Related Publication 20100123098A1 · May 20, 2010