Selective fault recovery of subsystems
Various embodiments are described herein with regards to performing a selective fault recovery for an electronic device having a plurality of subsystems in which one of the subsystems has a fault. The selective fault recovery techniques described herein allow a user to use non-faulty subsystem of the electronic device while selective fault recovery is being conducted on the subsystem having the fault.
1. A method of selective fault recovery during operation of an electronic device, wherein the method comprises:
detecting a fault in a subsystem of the electronic device;
performing a state reset of the subsystem having the detected fault;
performing a power reset of the subsystem having the detected fault when the fault persists after performing the state reset of the subsystem having the detected fault;
notifying a user of the electronic device of the fault when the fault persists after performing the power reset of the subsystem having the detected fault and providing the user with an option to perform a reset of the system;
performing a state reset of the system upon receiving approval for performing the reset of the system;
performing a power reset of the system when the fault persists after performing the state reset of the system;
wherein if approval is not received for performing the reset of the system or the fault persists after performing the power reset of the system, the method further comprises:
powering down the subsystem having the detected fault; and
notifying the user that the subsystem having the detected fault is not functional.
2. The method of claim 1 , wherein performing the state reset of the subsystem having the detected fault comprises re-initializing components in the subsystem having the detected fault to return to an initial state.
3. The method of claim 1 , wherein performing the power reset of the subsystem having the detected fault comprises performing a controlled power down of various components in the subsystem and then re-powering the components in a predetermined sequence.
4. The method of claim 1 , wherein detecting the fault comprises measuring a temperature of the subsystem and measuring the current drawn by the subsystem.
5. The method of claim 1 , further comprising using a first processor to perform the state reset of the subsystem and the state reset of the system and using a second processor to perform the power reset of the subsystem and the power reset of the system.
6. A non-transitory computer readable medium comprising a plurality of instructions executable on a microprocessor of an electronic device for adapting the microprocessor to implement a method of selective fault recovery during operation of the electronic device, wherein the method comprises:
detecting a fault in a subsystem of the electronic device;
performing a state reset of the subsystem having the detected fault;
performing a power reset of the subsystem having the detected fault when the fault persists after performing the state reset of the subsystem having the detected fault;
notifying a user of the electronic device of the fault when the fault persists after performing the power reset of the subsystem having the detected fault and providing the user with an option to perform a reset of the system;
performing a state reset of the system upon receiving approval for performing the reset of the system;
performing a power reset of the system when the fault persists after performing the state reset of the system;
wherein if approval is not received for performing the reset of the system or the fault persists after performing the power reset of the system, the method further comprises:
powering down the subsystem having the detected fault; and
notifying the user that the subsystem having the detected fault is not functional.
7. The non-transitory computer readable medium of claim 6 , wherein performing the state reset of the subsystem having the detected fault comprises re-initializing components in the subsystem having the detected fault to return to an initial state.
8. The non-transitory computer readable medium of claim 6 , wherein performing the power reset of the subsystem having the detected fault comprises performing a controlled power down of various components in the subsystem and then re-powering the components in a predetermined sequence.
9. The computer readable medium of claim 6 , wherein detecting the fault comprises measuring a temperature of the subsystem and measuring the current drawn by the subsystem.
10. An electronic device comprising:
a plurality of subsystems for providing various functions;
sensors coupled to the plurality of subsystems for obtaining measurements used in detecting faults in the subsystems; and
at least one processor for performing selective fault recovery during operation of the electronic device, the at least one processor being coupled to the plurality of subsystems via power switches and reset lines, and the at least one processor being configured to detect a fault in one of the subsystems, to perform a state reset of the subsystem having the detected fault, to perform a power reset of the subsystem having the detected fault when the fault persists after performing the state reset of the subsystem having the detected fault, to notify a user of the electronic device of the fault when the fault persists after performing the power reset of the subsystem having the detected fault and to provide the user with an option to perform a reset of the system, to perform a state reset of the system upon receiving approval for performing the reset of the system, and then to perform a power reset of the system when the fault persists after performing the state reset of the system, wherein if approval is not received for performing the reset of the system or the fault persists after performing the power reset of the system, the at least one processor is further configured to power down the subsystem having the detected fault, and to notify the user that the subsystem having the detected fault is not functional.
11. The electronic device of claim 10 , wherein the state reset of the subsystem having the detected fault comprises re-initializing components in the subsystem having the detected fault to return to an initial state.
12. The electronic device of claim 10 , wherein the power reset of the subsystem having the detected fault comprises performing a controlled power down of various components in the subsystem and then re-powering the components in a predetermined sequence.
13. The electronic device of claim 10 , wherein the sensors comprise temperature sensors and current sensors associated with each of the plurality of subsystems and detecting the fault comprises measuring temperature and current drawn by the subsystems.
14. The electronic device of claim 10 , wherein the device comprises first and second processors, the first processor being configured to perform the state reset of the subsystem having the detected fault and the state reset of the system and the second processor being configured to perform the power reset of the subsystem having the detected fault and the power reset of the system.
15. The electronic device of claim 14 , wherein the first processor is coupled to the subsystems with the reset lines and the second processor is coupled to the subsystems with the reset lines and the power switches.