Detector and charged particle beam instrument
A detector ( 100 ) is used to detect a charged particle beam (EB), and includes a first light emission portion ( 10 ) for converting the charged particle beam into light, a second light emission portion ( 20 ) for converting the charged particle beam transmitted through the first light emission portion ( 10 ) into light, and a light detector ( 30 ) for detecting the light produced by the first light emission portion ( 10 ) and the light produced by the second light emission portion ( 20 ). The first light emission portion ( 10 ) is a powdered scintillator. The second light emission portion ( 20 ) is a single crystal scintillator.
1. A detector for detecting a charged particle beam, said detector comprising:
a first light emission portion for converting the charged particle beam into light;
a second light emission portion for converting the charged particle beam transmitted through the first light emission portion into light; and
a light detector for detecting the light produced by the first light emission portion and the light produced by the second light emission portion,
wherein said first light emission portion is a powdered scintillator and said second light emission portion is a single crystal scintillator.
2. The detector as set forth in claim 1 , wherein said second light emission portion transmits the light produced by said first light emission portion, and wherein said light detector detects the light which is transmitted through the said second light emission portion after being produced by the first light emission portion.
3. The detector as set forth in claim 2 , wherein said first light emission portion has a thickness between 5 μm and 500 μm, inclusively.
4. The detector as set forth in claim 3 , further comprising a conductive film with which said first light emission portion is coated.
5. The charged particle beam instrument including a detector as set forth in claim 4 .