IP Library Granted Patent US 9,030,080
Granted Patent B2
US 9,030,080 · App. 13/681,893 · Granted May 12, 2015

Microelectromechanical systems (MEMS) resonators and related apparatus and methods

Inventors: David M. Chen (Brookline, MA); Jan H. Kuypers (Cambridge, MA); Pritiraj Mohanty (Los Angeles, CA); Klaus Juergen Schoepf (Chandler, AZ); Guiti Zolfagharkhani (Brighton, MA); Jason Goodelle (Boston, MA); Reimund Rebel (Maricopa, AZ)
Assignee: Sand 9, Inc.
H01L41/053H03H3/007H03H9/02007H03H9/02244H03H9/02535H03H2009/241B81B3/0018H02N1/006
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Quick Facts
Patent No.
US 9,030,080
App. No.
13/681,893
Granted
May 12, 2015
Kind
B2
Abstract

Devices having piezoelectric material structures integrated with substrates are described. Fabrication techniques for forming such devices are also described. The fabrication may include bonding a piezoelectric material wafer to a substrate of a differing material. A structure, such as a resonator, may then be formed from the piezoelectric material wafer.

Claims (21)

1. A capped microelectromechanical systems (MEMS) resonator, comprising:

a piezoelectric microelectromechanical systems (MEMS) resonating structure formed on a first wafer, the piezoelectric MEMS resonating structure comprising a resonating body including a piezoelectric material active layer and a layer of silicon; and

a cap wafer capping the piezoelectric MEMS resonating structure, wherein the cap wafer comprises no integrated circuitry,

wherein the cap wafer comprises an integrated heater.

2. The capped MEMS resonator of claim 1 , wherein the cap wafer is formed of an insulating material, and wherein the capped MEMS resonator further comprises through-silicon vias (TSVs) in the cap wafer and configured to conduct electrical signals between the piezoelectric MEMS resonating structure and circuitry formed external to the capped MEMS resonator.

3. The capped MEMS resonator of claim 2 , wherein the insulating material comprises glass.

4. The capped MEMS resonator of claim 2 , wherein the insulating material comprises ceramic.

5. The capped MEMS resonator of claim 1 , wherein the cap wafer is a silicon substrate.

6. The capped MEMS resonator of claim 5 , wherein the silicon substrate is a thinned silicon substrate.

7. The capped MEMS resonator of claim 5 , wherein the silicon substrate is an non-thinned silicon substrate.

8. A capped microelectromechanical systems (MEMS) resonator, comprising:

a piezoelectric microelectromechanical systems (MEMS) resonating structure formed on a first wafer, the piezoelectric MEMS resonating structure comprising a resonating body including a piezoelectric material active layer and a layer of silicon; and

a cap wafer capping the piezoelectric MEMS resonating structure, wherein the cap wafer comprises no integrated circuitry,

wherein the cap wafer comprises an integrated thermistor.

9. The capped MEMS resonator of claim 1 , wherein the cap wafer comprises no active circuitry.

10. The capped MEMS resonator of claim 1 , wherein the cap wafer comprises an access hole formed therein.

11. The capped MEMS resonator of claim 1 , coupled to an external circuit configured to control operation of the piezoelectric MEMS resonating structure.

12. The capped MEMS resonator of claim 11 , wherein the cap wafer is formed of an insulating material, and wherein the capped MEMS resonator further comprises through-silicon vias (TSVs) in the cap wafer and configured to conduct electrical signals between the piezoelectric MEMS resonating structure and circuitry formed external to the capped MEMS resonator.

13. The capped MEMS resonator of claim 8 , wherein the cap wafer is formed of an insulating material, and wherein the capped MEMS resonator further comprises through-silicon vias (TSVs) in the cap wafer and configured to conduct electrical signals between the piezoelectric MEMS resonating structure and circuitry formed external to the capped MEMS resonator.

14. The capped MEMS resonator of claim 8 , wherein the cap wafer is a silicon substrate.

15. The capped MEMS resonator of claim 8 , wherein the cap wafer comprises an access hole formed therein.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 4, 2015
From: SAND 9, INC.
To: ANALOG DEVICES, INC.
Reel/Frame 036274/0273 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 6, 2013
From: CHEN, DAVID M.; KUYPERS, JAN H.; MOHANTY, PRITIRAJ; SCHOEPF, KLAUS JUERGEN; ZOLFAGHARKHANI, GUITI; GOODELLE, JASON
To: SAND 9, INC.
Reel/Frame 029932/0596 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 6, 2013
From: REBEL, REIMUND
To: SAND 9, INC.
Reel/Frame 029932/0808 →
Continuity (15)
Division 13466767 · May 8, 2012
Continuation In Part 12750768 · Mar 31, 2010
Continuation In Part 12781076 · May 17, 2010
Continuation In Part 12899447 · Oct 6, 2010
Continuation In Part 12750768 · Mar 31, 2010
Continuation In Part 13191851 · Jul 27, 2011
Continuation In Part 13247318 · Sep 28, 2011
Continuation 12111535 · Apr 29, 2008
Provisional Application 61165405 · Mar 31, 2009
Provisional Application 61184167 · Jun 4, 2009
Provisional Application 61368216 · Jul 27, 2010
Provisional Application 61368218 · Jul 27, 2010
Provisional Application 61368224 · Jul 27, 2010
Provisional Application 61368227 · Jul 27, 2010
Related Publication 20130140651A1 · Jun 6, 2013