System and method of enhancing data reliability
In a system and method of enhancing data reliability, a reference value associated with error count is obtained, and an error count of data stored in a buffer is obtained whenever an event is triggered. An accumulated value associated with error counts is acquired when the recorded error count is greater than an error threshold value. System slowdown is performed when the accumulated value is greater than a predetermined value.
1. A method of enhancing data reliability, comprising:
obtaining a reference value associated with error count of a memory device;
obtaining an error count of data stored in a buffer whenever an event is triggered during a memory access operation;
comparing the error count with an error threshold value, which is greater than the reference value;
acquiring an accumulated value associated with error counts when the error count is greater than the error threshold value;
comparing the accumulated value with a predetermined value; and
performing system slowdown when the accumulated value is greater than the predetermined value.
2. The method of claim 1 , wherein the reference value is obtained while the memory device is initialized or booted, during which a logic-to-physical address mapping table is constructed.
3. The method of claim 2 , wherein the reference value is obtained by averaging error counts of at least some pages of the memory device.
4. The method of claim 1 , before the step of comparing the error count with the error threshold value, further comprising a step of comparing the error count with the reference value.
5. The method of claim 1 , wherein the memory access operation comprises a copyback operation, a write operation or a read operation or an erase operation.
6. The method of claim 1 , wherein the event is triggered by behavior of a host.
7. The method of claim 6 , wherein the event is triggered when the host issues a test unit ready command.
8. The method of claim 6 , wherein the acquired accumulated value is an amount of the events with error counts being greater than the error threshold value.
9. The method of claim 1 , wherein the event is triggered by a timer of a memory controller when a predetermined time has elapsed.
10. The method of claim 9 , wherein the acquired accumulated value is a time interval during which error counts being greater than the error threshold value.
11. The method of claim 1 , wherein the event is triggered by behavior of the memory device.
12. The method of claim 11 , wherein the event is triggered whenever a predetermined amount of blocks of the memory device has been subjected to programming or erasing, or whenever a predetermined amount of retired blocks of the memory device has been identified.
13. The method of claim 11 , wherein the acquired accumulated value is an amount of the events with error counts being greater than the error threshold value.
14. The method of claim 1 , wherein the system slowdown is performed on an interface of the memory device and/or a processor of a memory controller.
15. The method of claim 1 , wherein the system slowdown comprises performing a plurality of dummy operations by a host.
16. The method of claim 1 , wherein the system slowdown comprises separating program/erase operations in time with proper time gap between adjacent program/erase operations.
17. A system of enhancing data reliability, comprising:
a host;
a memory controller adaptably coupled to the host;
a memory device adaptably coupled to the memory controller, the memory device; and
a buffer configured to store data associated with a memory access operation;
wherein the memory controller performs:
obtaining a reference value associated with error count of the memory device;
obtaining an error count of data in the buffer whenever an event is triggered during the memory access operation;
comparing the error count with an error threshold value, which is greater than the reference value;
acquiring an accumulated value associated with error counts when the error count is greater than the error threshold value; and
comparing the accumulated value with a predetermined value;
wherein at least a portion of the memory system is slowed down when the accumulated value is greater than the predetermined value.
18. The system of claim 17 , wherein the memory device comprises a flash memory.
19. The system of claim 17 , wherein the event is triggered by behavior of the host.
20. The system of claim 19 , wherein the event is triggered when the host issues a test unit ready command.
21. The system of claim 19 , wherein the acquired accumulated value is an amount of the events with error counts being greater than the error threshold value.
22. The system of claim 17 , wherein the memory controller comprises a timer configured to measure a time interval, and the event is triggered by the timer when a predetermined time measured by the timer has elapsed.
23. The system of claim 22 , wherein the acquired accumulated value is a time interval during which error counts being greater than the error threshold value.
24. The system of claim 17 , wherein the event is triggered by behavior of the memory device.
25. The system of claim 24 , wherein the event is triggered whenever a predetermined amount of blocks of the memory device has been subjected to programming or erasing, or whenever a predetermined amount of retired blocks of the memory device has been identified.
26. The system of claim 24 , wherein the acquired accumulated value is an amount of the events with error counts being greater than the error threshold value.
27. The system of claim 17 , wherein the system slowdown is performed on an interface of the memory device and/or a processor of a memory controller.