IP Library Granted Patent US 9,035,457
Granted Patent B2
US 9,035,457 · App. 13/689,727 · Granted May 19, 2015

Substrate with integrated passive devices and method of manufacturing the same

Inventors: Chu-Fu Lin (Kaohsiung, TW); Ming-Tse Lin (Hsinchu, TW); Yung-Chang Lin (Taichung, TW)
Assignee: UNITED MICROELECTRONICS CORP.
H01L24/11H01L23/147H01L23/49822H01L23/49827H01L23/49894H01L23/5223H01L23/5227H01L23/5228H01L23/481H01L23/525
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Quick Facts
Patent No.
US 9,035,457
App. No.
13/689,727
Granted
May 19, 2015
Kind
B2
Abstract

A substrate with integrated passive devices and method of manufacturing the same are presented. The substrate may include through silicon vias, at least one redistribution layer having a 1st passive device pattern and stacked vias, and an under bump metal layer having a 2nd passive device pattern.

Claims (28)

1. A substrate with integrated passive devices, comprising:

a substrate;

at least one dielectric layer formed on said substrate;

a redistribution layer formed on said at least one dielectric layer;

a topmost dielectric layer formed on said at least one dielectric layer and said redistribution layer;

an under bump metal layer formed directly on said topmost dielectric layer, wherein said under bump metal layer comprises a first integrated passive device pattern; and

bumps formed directly on said under bump metal layer.

2. The substrate with integrated passive devices according to claim 1 , wherein said redistribution layer comprises a second integrated passive device pattern, redistribution traces and stacked vias.

3. The substrate with integrated passive devices according to claim 2 , wherein said first integrated passive device pattern and said second integrated passive device pattern comprise resistors, capacitors, inductors, baluns, filters or diplexers.

4. The substrate with integrated passive devices according to claim 1 , wherein said first integrated passive device pattern comprises under bump metal and bump metal.

5. The substrate with integrated passive devices according to claim 1 , wherein said redistribution layer is electrically connected to a through silicon via in said substrate.

6. The substrate with integrated passive devices according to claim 1 , wherein said at least one dielectric layer, said redistribution layer and said under bump metal layer are formed on the backside of said substrate.

7. The substrate with integrated passive devices according to claim 1 , wherein the material of said at least one dielectric layer comprises polyimide (PI), poly-phenylene benzobisoxazole (PBO) or benzo-cyclobutene (BCB).

8. The substrate with integrated passive devices according to claim 1 , wherein said substrate is a wafer level package substrate.

9. The substrate with integrated passive devices according to claim 1 , wherein said bumps are solder bumps, micro bumps or C4 bumps.

10. The substrate with integrated passive devices according to claim 1 , wherein the material of said under bump metal layer is different from the material of said redistribution layer.

11. A substrate with integrated passive devices, comprising:

a substrate;

at least one dielectric layer formed on said substrate;

a redistribution layer formed on said at least one dielectric layer, wherein said redistribution layer comprises a first integrated passive device pattern, redistribution traces and stacked vias;

a topmost dielectric layer formed on said at least one dielectric layer and said redistribution layer;

an under bump metal layer formed directly on said topmost dielectric layer, wherein said under bump metal layer comprises a second integrated passive device pattern; and

bumps formed directly on said under bump metal layer.

12. The substrate with integrated passive devices according to claim 11 , wherein said at least one dielectric layer, said redistribution layer and said under bump metal layer are formed on the backside of said substrate.

13. The substrate with integrated passive devices according to claim 11 , wherein the material of said at least one dielectric layer comprises polyimide (PI), poly-phenylene benzobisoxazole (PBO) or benzo-cyclobutene (BCB).

14. The substrate with integrated passive devices according to claim 11 , wherein said first integrated passive device pattern and said second integrated passive device pattern comprise resistors, capacitors, inductors, baluns, filters or diplexers.

15. The substrate with integrated passive devices according to claim 11 , wherein said bumps are solder bumps, micro bumps or C4 bumps.

16. The substrate with integrated passive devices according to claim 11 , wherein the material of said under bump metal layer is different from the material of said redistribution layer.

Assignments (2)
SECURITY AGREEMENT Recorded Mar 27, 2013
From: OCZ TECHNOLOGY GROUP, INC.
To: HERCULES TECHNOLOGY GROWTH CAPITAL, INC.
Reel/Frame 030092/0739 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 29, 2012
From: LIN, CHU-FU; LIN, MING-TSE; LIN, YUNG-CHANG
To: UNITED MICROELECTRONICS CORP.
Reel/Frame 029377/0809 →
Continuity (1)
Related Publication 20140145326A1 · May 29, 2014