IP Library Granted Patent US 9,056,405
Granted Patent B2
US 9,056,405 · App. 13/913,335 · Granted Jun 16, 2015

Treatment method for mold tool surface

Inventors: Akinobu Sato (Tokyo, JP); Akiko Suzuki (Tokyo, JP); Takeshi Kawano (Tokyo, JP)
Assignee: JAPAN AVIATION ELECTRONICS INDUSTRY, LIMITED
B29C33/42
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Quick Facts
Patent No.
US 9,056,405
App. No.
13/913,335
Granted
Jun 16, 2015
Kind
B2
Abstract

The average roughness Ra of a mold tool surface that comes into contact with a material to be molded measured for a measurement area 10 μm square or smaller is equal to or lower than 5 nm, and fine granular projection structures having diameters ranging from 10 to 80 nm and heights ranging from 10 to 40 nm are formed on the mold tool surface with a density of 400/μm 2 or higher. The frictional force due to the anchoring effect or the digging effect is reduced, and the adhesive force due to meniscus is also reduced. The release resistance is significantly reduced without affecting the dimensional precision of a fine molded product.

Claims (2)

1. A treatment method for a mold tool surface of a mold tool that comes into contact with a material to be molded, comprising: providing an average roughness Ra of the mold tool surface measured for an area from 1 μm to 10 μm square and irradiation fluence of a gas cluster ion beam applied to the mold tool surface are in such a relationship that the average roughness Ra first decreases, then increases and finally levels off at a certain value as the irradiation fluence increases, and the mold tool surface is irradiated with the gas cluster ion beam in a fluence equal to or higher than the irradiation fluence at the time when the average roughness Ra levels off at the certain value.

2. A treatment method, comprising providing a mold tool surface of a mold tool that comes into contact with a material to be molded, wherein an average roughness Ra of the mold tool surface measured for an area from 1 μm to 10 μm square and irradiation fluence of a gas cluster ion beam applied to the mold tool surface are in such a relationship that the average roughness Ra first decreases, then increases and finally levels off at a certain value as the irradiation fluence increases, and the mold tool surface is irradiated with the gas cluster ion beam in a fluence equal to or higher than the irradiation fluence at the time when the average roughness Ra levels off at the certain value, thereby making the average roughness Ra of the mold tool surface measured for an area from 1 μm to 10 μm square is equal to or lower than 5 nm and forming fine granular projection structures having diameters ranging from 10 to 80 nm and heights ranging from 10 to 40 nm on the mold tool surface with a density of 400/μm 2 or higher.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 7, 2013
From: SATO, AKINOBU; SUZUKI, AKIKO; KAWANO, TAKESHI
To: JAPAN AVIATION ELECTRONICS INDUSTRY, LIMITED
Reel/Frame 030571/0499 →
Continuity (2)
Division 12877985 · Sep 8, 2010
Related Publication 20130270734A1 · Oct 17, 2013