IP Library › Granted Patent US 9,058,770
Granted Patent B2
US 9,058,770 · App. 13/957,371 · Granted Jun 16, 2015

Circuit for preventing static electricity and display device having the same

Inventors: Yong-Jae Kim (Yongin, KR); Bo-Yong Chung (Yongin, KR); Hae-Yeon Lee (Yongin, KR)
Assignee: Samsung Display Co., Ltd.
G09G3/3208G02F1/136204H01L29/4232H01L23/60H01L27/0266H01L27/027H01L27/0296G02F2202/22G09G2330/04H01L2924/0002H01L27/3276
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Quick Facts
Patent No.
US 9,058,770
App. No.
13/957,371
Granted
Jun 16, 2015
Kind
B2
Abstract

A static electricity prevention circuit of a display device including: a driving circuit configured to drive a display unit that displays an image, at least one clock signal wire configured to transmit a clock signal to the driving circuit, at least one transistor electrically coupled to the dock signal wire, and at least one capacitor including a first electrode coupled to a source electrode and to a drain electrode of the transistor, and a second electrode configured to be maintained at a voltage,

Claims (33)

1. A static electricity prevention circuit of a display device comprising:

a driving circuit configured to drive a display unit that displays an image;

at least one dock signal wire configured to transmit a dock signal to the driving circuit,

at least one transistor electrically coupled to the clock signal wire; and

at least one capacitor comprising a first electrode coupled to a source electrode and to a drain electrode of the transistor, and a second electrode configured to be maintained at a voltage.

2. The static electricity prevention circuit of claim 1 , wherein the clock signal wire is coupled with a gate electrode of the transistor through a gate metal wire.

3. The static electricity prevention circuit of claim 1 , wherein the transistor comprises:

a semiconductor layer comprising an impurity-doped area doped with a semiconductor impurity, and an intrinsic semiconductor area not doped with any semiconductor impurity;

a gate electrode layer on the semiconductor layer; and

a gate insulation layer between the gate electrode layer and the semiconductor layer,

wherein the gate insulation layer is configured to create an electrical open or an electrical short-circuit by a static electricity current flowing through the clock signal wire.

4. The static electricity prevention circuit of claim 3 , wherein the impurity-doped area of the semiconductor layer comprises:

a first impurity-doped area; and

a second impurity-doped area opposite to the first impurity-doped area and electrically coupled to a portion of the first impurity-doped area not overlapping the gate electrode layer.

5. The static electricity prevention circuit of claim 3 , further comprising a capacitor comprising a first electrode that is electrically coupled to the impurity-doped area of the semiconductor layer, the capacitor being configured to accumulate an inflow static electricity current when the gate insulation layer is short-circuited.

6. A display device comprising:

a display unit comprising a plurality of pixels configured to display an image by emitting light based on a data voltage corresponding to an image data signal;

a driving circuit configured to drive the display unit;

at least one dock signal wire configured to transmit a clock signal to the driving circuit; and

a static electricity prevention circuit comprising:

at least one transistor electrically coupled to the dock signal wire; and

at least one capacitor comprising a first electrode coupled to both of a source electrode and a drain electrode of the transistor, and a second electrode configured to be applied with a fixed voltage.

7. The display device of claim 6 , wherein the static electricity prevention circuit is coupled between the dock signal wire and the driving circuit.

8. The display device of claim 6 , wherein the clock signal wire is coupled to a gate electrode of the transistor of the static electricity prevention circuit through a gate metal wire.

9. The display device of claim 6 , wherein the transistor comprises:

a semiconductor layer comprising an impurity-doped area that is doped with a semiconductor impurity and is electrically coupled to the first electrode of the capacitor, and an intrinsic semiconductor layer that is not doped with any semiconductor impurity;

a gate electrode layer on the semiconductor layer; and

a gate insulation layer between the gate electrode layer and the semiconductor layer.

10. The display device of claim 9 , wherein the impurity-doped area of the semiconductor comprises:

a first impurity-doped area; and

a second impurity-doped area opposite to the first impurity-doped area and electrically coupled to a portion of the first impurity-doped area not overlapping the gate electrode layer.

11. The display device of claim 9 , wherein the gate insulation layer is configured to cause an electrical open circuit or to an electrical short-circuit due to a static electricity current flowing through at least one clock signal wire.

12. The display device of claim 11 , further comprising a capacitor comprising a first electrode that is electrically coupled to the impurity-doped area of the semiconductor layer, the capacitor being configured to accumulate an inflow static electricity current when the gate insulation layer is short-circuited.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 1, 2013
From: KIM, YONG-JAE; CHUNG, BO-YONG; LEE, HAE-YEON
To: SAMSUNG DISPLAY CO., LTD
Reel/Frame 030937/0797 →
Priority Claims (1)
KR 10-2013-0009434 · Jan 28, 2013 · national
Continuity (1)
Related Publication 20140210807A1 · Jul 31, 2014