IP Library Granted Patent US 9,059,047
Granted Patent B2
US 9,059,047 · App. 14/183,755 · Granted Jun 16, 2015

Semiconductor device

Inventor: Shunpei Yamazaki (Tokyo, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H01L27/1225
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Quick Facts
Patent No.
US 9,059,047
App. No.
14/183,755
Granted
Jun 16, 2015
Kind
B2
Abstract

An object is to provide a semiconductor device using an oxide semiconductor having stable electric characteristics and high reliability. A transistor including the oxide semiconductor film in which a top surface portion of the oxide semiconductor film is provided with a metal oxide film containing a constituent similar to that of the oxide semiconductor film and functioning as a channel protective film is provided. In addition, the oxide semiconductor film used for an active layer of the transistor is an oxide semiconductor film highly purified to be electrically i-type (intrinsic) by heat treatment in which impurities such as hydrogen, moisture, a hydroxyl group, or a hydride are removed from the oxide semiconductor and oxygen which is a major constituent of the oxide semiconductor and is reduced concurrently with a step of removing impurities is supplied.

Claims (68)

1. A display device comprising:

a pixel electrode; and

a transistor,

wherein the transistor comprises:

a gate electrode;

a gate insulating film over the gate electrode;

an oxide semiconductor film including a channel formation region;

a metal oxide film over the oxide semiconductor film; and

a source electrode and a drain electrode over and in contact with the oxide semiconductor film and the metal oxide film,

wherein the metal oxide film overlaps the channel formation region,

wherein the oxide semiconductor film contains one or more metal elements, and

wherein the metal oxide film contains at least one of the metal elements contained in the oxide semiconductor film, and

wherein the pixel electrode is electrically connected to one of the source electrode and the drain electrode.

2. The display device according to claim 1 , wherein a side edge of the oxide semiconductor film is aligned with a side edge of the metal oxide film.

3. The display device according to claim 1 , wherein a side surface of the oxide semiconductor film is in contact with the metal oxide film.

4. The display device according to claim 1 , wherein the source electrode and the drain electrode are in contact with the oxide semiconductor film through openings of the metal oxide film.

5. The display device according to claim 1 , wherein the metal oxide film has a larger band gap than the oxide semiconductor film.

6. The display device according to claim 1 ,

wherein the oxide semiconductor film contains indium, gallium and zinc, and

wherein the metal oxide film contains at least gallium.

7. The display device according to claim 1 , further comprising:

an insulating film over the source electrode, the drain electrode and the metal oxide film; and

an electrode over the insulating film and overlapping with the gate electrode.

8. The display device according to claim 1 , wherein the source electrode and the drain electrode comprise a metal selected from aluminum, chromium, cupper, tantrum, molybdenum and tungsten.

9. An electronic appliance comprising the display device according to claim 1 .

10. A display device comprising:

a pixel electrode; and

a transistor,

wherein the transistor comprises:

an oxide semiconductor film including a channel formation region;

a metal oxide film over the oxide semiconductor film;

a source electrode and a drain electrode over and in contact with the oxide semiconductor film and the metal oxide film,

a gate insulating film over the oxide semiconductor film, the metal oxide film, the source electrode and the drain electrode; and

a gate electrode over the gate insulating film,

wherein the metal oxide film overlaps the channel formation region,

wherein the oxide semiconductor film contains one or more metal elements, and

wherein the metal oxide film contains at least one of the metal elements contained in the oxide semiconductor film, and

wherein the pixel electrode is electrically connected to one of the source electrode and the drain electrode.

11. The display device according to claim 10 , wherein a side edge of the oxide semiconductor film is aligned with a side edge of the metal oxide film.

12. The display device according to claim 10 , wherein a side surface of the oxide semiconductor film is in contact with the metal oxide film.

13. The display device according to claim 10 , wherein the metal oxide film has a larger band gap than the oxide semiconductor film.

14. The display device according to claim 10 ,

wherein the oxide semiconductor film contains indium, gallium and zinc, and

wherein the metal oxide film contains at least gallium.

15. The display device according to claim 10 , wherein the source electrode and the drain electrode comprise a metal selected from aluminum, chromium, cupper, tantrum, molybdenum and tungsten.

16. An electronic appliance comprising the display device according to claim 10 .

17. A display device comprising:

a pixel electrode; and

a transistor;

wherein the transistor comprises:

a gate electrode;

a gate insulating film over the gate electrode;

a first metal oxide film over the gate insulating film;

an oxide semiconductor film including a channel formation region over the first metal oxide film;

a second metal oxide film over the oxide semiconductor film; and

a source electrode and a drain electrode over and in contact with the oxide semiconductor film and the second metal oxide film,

wherein the channel formation region is between the first metal oxide film and the second metal oxide film,

wherein the oxide semiconductor film contains one or more metal elements, and

wherein the first metal oxide film and the second metal oxide film contain at least one of the metal elements contained in the oxide semiconductor film, and

wherein the pixel electrode is electrically connected to one of the source electrode and the drain electrode.

18. The display device according to claim 17 , wherein a side edge of the oxide semiconductor film is aligned with a side edge of the second metal oxide film.

19. The display device according to claim 17 , wherein a side surface of the oxide semiconductor film is in contact with the second metal oxide film.

20. The display device according to claim 17 , wherein each of the first metal oxide film and the second metal oxide film has a larger band gap than the oxide semiconductor film.

21. The display device according to claim 17 ,

wherein the oxide semiconductor film contains indium, gallium and zinc, and

wherein the first metal oxide film and the second metal oxide film contain at least gallium.

22. The display device according to claim 17 , wherein the source electrode and the drain electrode comprises a metal selected from aluminum, chromium, cupper, tantrum, molybdenum and tungsten.

23. An electronic appliance comprising the display device according to claim 17 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 9, 2014
From: YAMAZAKI, SHUNPEI
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 032633/0815 →
Priority Claims (1)
JP 2010-090539 · Apr 9, 2010 · national
Continuity (2)
Continuation 13080046 · Apr 5, 2011
Related Publication 20140167039A1 · Jun 19, 2014