IP Library Granted Patent US 9,061,353
Granted Patent B2
US 9,061,353 · App. 13/513,712 · Granted Jun 23, 2015

Production method for high purity copper powder using a thermal plasma

Inventors: Dae Hyun Kim (Ulsan-si, KR); Dong Woo Lee (Incheon-si, KR); In Dal Kim (Gyeonggi-do, KR); Sang Young Choi (Seoul, KR); Ji Hoon Lee (Ulsan-si, KR); Bo Min Jeon (Ulsan-si, KR)
Assignee: POONGSAN CORPORATION
B22F9/12B22F2998/10B22F2999/00B22F1/0048C23C14/3414
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Quick Facts
Patent No.
US 9,061,353
App. No.
13/513,712
Granted
Jun 23, 2015
Kind
B2
Abstract

The present invention relates to a method of manufacturing a high purity copper (Cu) powder material useable in fabricating a sputtering target material for electronic industrial applications, for example a penetrator liner. The foregoing method has a configuration of using an apparatus composed of a raw material feeder, a plasma torch and a reactor to prepare a metal powder, and includes steps of passing a Cu powder having an average particle diameter of 30 to 450 μm through the thermal plasma torch at an introduction rate of 2 to 30 kg/hr, to thereby fabricate a Cu powder having an average particle diameter of 5 to 300 μm.

Claims (3)

1. A method of manufacturing a high purity spherical copper (Cu) powder through plasma, which uses an apparatus composed of a raw material feeder, a thermal plasma torch and a reactor to prepare a metal powder, wherein the plasma is a thermal plasma generated from a gas that includes argon with 5 to 50% by volume of hydrogen added, and the reactor is formed to have a length of 1.4 to 2.5 meters (m), comprising the steps of:

passing a Cu powder having an average particle diameter of 30 to 450 μm through the thermal plasma torch and the reactor at an introduction rate of 2 to 30 kg/hr, to thereby fabricate a Cu powder having an average particle diameter of 5 to 300 μm,

wherein the Cu powder having the average particle diameter of 30 to 450 μm has a purity of 95 to 99%, and the purity of the Cu powder having the average particle diameter of 5 to 300 μm is 4N grade (99.99%) or more.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 4, 2012
From: KIM, DAE HYUN; LEE, DONG WOO; KIM, IN DAL; CHOI, SANG YOUNG; LEE, JI HOON; JEON, BO MIN
To: POONGSAN CORPORATION
Reel/Frame 028311/0702 →
Priority Claims (1)
KR 10-2009-0120452 · Dec 7, 2009 · national
Continuity (1)
Related Publication 20120240726A1 · Sep 27, 2012