IP Library › Granted Patent US 9,070,456
Granted Patent B2
US 9,070,456 · App. 13/441,841 · Granted Jun 30, 2015

High density magnetic random access memory

Inventors: Tom A. Agan (Maple Grove, MN); Alexander Mikhailovich Shukh (Savage, MN)
G11C11/16
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Quick Facts
Patent No.
US 9,070,456
App. No.
13/441,841
Granted
Jun 30, 2015
Kind
B2
Abstract

A magnetic memory device that comprises a substrate, a memory cell including a magnetic tunnel junction which comprises a free ferromagnetic layer having a reversible magnetization direction directed perpendicular to the substrate, a pinned ferromagnetic layer having a fixed magnetization direction directed perpendicular to the substrate, and an insulating tunnel barrier layer disposed between the pinned and free layers, a first electrical circuit for applying a first current to a first conductor electrically coupled to the free layer to produce a bias magnetic field along a hard axis of the free layer, a second electrical circuit for applying a second current to a second conductor electrically coupled to the pinned layer to cause a spin momentum transfer in the free layer, wherein magnitudes of the bias magnetic field and spin momentum transfer in combination exceed a threshold and thus reverse the magnetization direction of the free layer.

Claims (14)

1. A magnetic memory device comprising:

a substrate;

a first plurality of conductive lines disposed on the substrate;

a second plurality of conductive lines disposed on the substrate and overlapping the first plurality of conductive lines at a plurality of intersection regions;

a plurality of magnetic tunnel junctions disposed on the substrate and arranged into an array, each magnetic tunnel junction being located at an intersection region and comprising a free ferromagnetic layer having a reversible magnetization direction directed substantially perpendicular to the substrate in an equilibrium state, a pinned ferromagnetic layer having a fixed magnetization direction directed perpendicular to the substrate, and a tunnel barrier layer disposed between the pinned ferromagnetic layer and the free ferromagnetic layer, a magnetic tunnel junction being electrically coupled to a conductive line of the first plurality of conductive lines at a first end adjacent to the free ferromagnetic layer and to a conductive line of the second plurality of conductive lines at a second end adjacent to the pinned ferromagnetic layer;

a first transistor comprising a first saturation current and electrically coupled to the conductive line of the first plurality of conductive lines; and

a second transistor comprising a second saturation current and electrically coupled to the conductive line of the second plurality of conductive lines;

wherein the first saturation current is substantially larger than the second saturation current; and

wherein the first transistor and the second transistor are disposed along a perimeter of the array of the magnetic tunnel junctions.

2. The magnetic memory device of claim 1 , wherein the magnetization direction of the free ferromagnetic layer is reversed by a spin-polarized current running through the magnetic tunnel junction in a direction perpendicular to the substrate.

3. The magnetic memory device of claim 2 , wherein the direction of the spin-polarized current in the magnetic tunnel junction is reversible.

4. The magnetic memory device of claim 1 , wherein each conductive line of the first plurality of conductive lines further comprising:

a ferromagnetic cladding disposed around the conductive line; and

a nonmagnetic gap disposed adjacent to the free ferromagnetic layer.

Continuity (2)
Provisional Application 61472788 · Apr 7, 2011
Related Publication 20120257449A1 · Oct 11, 2012