Anti-fuse circuit using MTJ breakdown and semiconductor device including same
An anti-fuse circuit includes an array of anti-fuses. Each anti-fuse has a tunneling magneto-resistance (TMR) element series connected with a transistor, such that breakdown of a magnetic tunnel junction (MTJ) in response to an applied first voltage stores fuse information. A sensing circuit senses and amplifies respective output signals provided by the anti-fuses.
1. An anti-fuse circuit comprising:
an array of anti-fuses, each anti-fuse comprising a tunneling magneto-resistance (TMR) element series connected with a transistor and configured to breakdown a magnetic tunnel junction (MTJ) of the TMR element in response to an applied first voltage, such that alternately provided normal resistance and breakdown resistance for the TMR define an output signal for the anti-fuse that indicates fuse information stored by the anti-fuse; and
a sensing circuit configured to sense and amplify the respective output signals provided by the anti-fuses.
2. The circuit of claim 1 , wherein the TMR element and transistor of each anti-fuse are provided by a magnetic random access memory (MRAM) cell.
3. The circuit of claim 2 , wherein the TMR element includes a first terminal connected to a corresponding bit line traversing the array of anti-fuses and a second terminal, and
the transistor includes a drain connected to the second terminal, a gate connected to a corresponding word line traversing the array of anti-fuses, and a source connected to a source line.
4. The circuit of claim 3 , wherein during programming of a selected MRAM cell, the first voltage is applied to a corresponding bit line, a second voltage is applied to a corresponding word line, and a low power supply voltage is applied to the source line.
5. The circuit of claim 4 , wherein the TMR element included in the selected MRAM cell is programmed by application of the first voltage to the corresponding bit line.
6. The circuit of claim 4 , wherein the first voltage ranges from between about 1V and 2V.
7. The circuit of claim 3 , wherein the TMR element comprises:
a pinned magnetic layer having a predetermined pinned magnetic direction;
a free magnetic layer configured to be magnetized in the direction of an externally applied magnetic field; and
a tunnel barrier layer formed of an insulating film between the pinned magnetic layer and the free magnetic layer.
8. The circuit of claim 7 , wherein an ON-state and an OFF-state for the anti-fuse are determined in accordance with whether or not a breakdown of the tunnel barrier layer has occurred.