IP Library › Granted Patent US 9,070,597
Granted Patent B2
US 9,070,597 · App. 14/262,769 · Granted Jun 30, 2015

Thin film transistor, display substrate and method of manufacturing a thin film transistor

Inventors: Byung-Du Ahn (Hwaseong-si, KR); Gun-Hee Kim (Hwaseong-si, KR); Jun-Hyung Lim (Seoul, KR); Toshihiro Kugimiya (Kobe, JP); Hiroshi Goto (Kobe, JP); Aya Miki (Kobe, JP); Shinya Morita (Kobe, JP)
Assignees: SAMSUNG DISPLAY CO., LTD.; KOBE STEEL, LTD.
H01L27/1225H01L29/78693H01L29/66969
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Quick Facts
Patent No.
US 9,070,597
App. No.
14/262,769
Granted
Jun 30, 2015
Kind
B2
Abstract

A thin film transistor includes a gate electrode, a channel overlapped with the gate electrode, a source electrode contacting the channel, and a drain electrode spaced apart from the source electrode and contacting the channel. The channel includes indium-zinc-tin oxide sourced from a source including a single phase indium-zinc-tin oxide.

Claims (43)

1. A thin film transistor comprising:

a gate electrode;

a channel overlapped with the gate electrode and comprising an indium-zinc-tin oxide sourced from a source comprising a single phase indium-zinc-tin oxide;

a source electrode contacting the channel; and

a drain electrode spaced apart from the source electrode and contacting the channel,

wherein the single phase indium-zinc-tin oxide of the source is represented by the following Chemical Formula 1

( x )ZnIn 2 O 4 (1− x )Zn 2 SnO 4 , wherein 0 <x <0.45.  Chemical Formula 1

2. The thin film transistor of claim 1 , wherein the indium-zinc-tin oxide of the channel is amorphous.

3. The thin film transistor of claim 1 , wherein the single phase indium-zinc-tin oxide of the source is crystalline.

4. The thin film transistor of claim 1 , wherein the electron mobility of the channel is about 10 cm 2 /V·s to about 40 cm 2 /V·s.

5. A display substrate comprising:

a gate electrode on a base substrate;

a channel overlapped with the gate electrode and comprising indium-zinc-tin oxide sourced from a source comprising a single phase indium-zinc-tin oxide;

a source electrode contacting the channel;

a drain electrode spaced apart from the source electrode and contacting the channel; and

a pixel electrode electrically connected to the drain electrode,

wherein the single phase indium-zinc-tin oxide of the source is represented by the following Chemical Formula 1

( x )ZnIn 2 O 4 (1− x )Zn 2 SnO 4 , wherein 0 <x< 0.45.  Chemical Formula 1

6. The display substrate of claim 5 , wherein the indium-zinc-tin oxide of the channel is amorphous.

7. The display substrate of claim 5 , wherein the single phase indium-zinc-tin oxide of the source is crystalline.

8. The display substrate of claim 5 , wherein the electron mobility of the channel is about 10 cm 2 /V·s to about 40 cm 2 /V·s.

9. The display substrate of claim 5 , wherein the gate electrode is between the base substrate and the channel.

10. The display substrate of claim 9 , further comprising an etch stopper on the channel,

wherein the source and the drain electrodes partially cover the etch stopper.

11. The display substrate of claim 5 , wherein

the channel is between the gate electrode and the base substrate, and

the channel, the source electrode and the drain electrode are in a same layer of the display substrate.

12. A method for manufacturing a thin film transistor, the method comprising:

providing an oxide semiconductor layer from a source comprising a single phase indium-zinc-tin oxide; and

patterning the oxide semiconductor layer to form a channel of the thin film transistor,

wherein the single phase indium-zinc-tin oxide of the source is represented by the following Chemical Formula 1

( x )ZnIn 2 O 4 (1− x )Zn 2 SnO 4 wherein 0 <x< 0.45.   Chemical Formula 1

13. The method of claim 12 , wherein the providing the oxide semiconductor layer comprises vapor deposition of the source.

14. The method of claim 13 , wherein the single phase indium-zinc-tin oxide of the source is crystalline.

15. The method of claim 14 , further comprising:

annealing the oxide semiconductor layer at a temperature of about 100° C. to about 700° C.

16. A thin film transistor comprising:

a gate electrode;

a channel overlapped with the gate electrode and comprising an indium-zinc-tin oxide sourced from a source comprising a single phase indium-zinc-tin oxide;

a source electrode contacting the channel; and

a drain electrode spaced apart from the source electrode and contacting the channel

wherein the indium-zinc-tin oxide of the channel is represented by the following Chemical Formula 1

( x )ZnIn 2 O 4 (1− x )Zn 2 SnO 4 , wherein 0 <x< 0.45.   Chemical Formula 1

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 9, 2021
From: KOBE STEEL, LTD.
To: SAMSUNG DISPLAY CO., LTD.
Reel/Frame 058350/0743 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 28, 2014
From: AHN, BYUNG-DU; KIM, GUN-HEE; LIM, JUN-HYUNG; KUGIMIYA, TOSHIHIRO; GOTO, HIROSHI; MIKI, AYA; MORITA, SHINYA
To: SAMSUNG DISPLAY CO., LTD.; KOBE STEEL, LTD.
Reel/Frame 032972/0717 →
Priority Claims (1)
KR 10-2013-0058272 · May 23, 2013 · national
Continuity (1)
Related Publication 20140346498A1 · Nov 27, 2014