Systems, processes and computer-accessible medium for providing logic encryption utilizing fault analysis
Exemplary systems, methods and computer-accessible mediums can encrypting a circuit by determining at least one location to insert at least one gate in the circuit using a fault analysis, and inserting the at least one gate in at least one section of the at least one location. The determination can include an iterative procedure that can be a greedy iterative procedure. The determination can be based on an effect of the particular location on a maximum number of outputs of the circuit.
1. A process for encrypting a circuit, including:
determining at least one location to insert at least one gate in the circuit using a fault analysis procedure that identifies a number of outputs affected by the at least one location; and
encrypting the circuit by inserting the at least one gate, with one input of the at least one gate controlled by at least one key input bit, in at least one section of the at least one location.
2. The process of claim 1 , wherein the determination includes an iterative procedure.
3. The process of claim 2 , wherein the iterative procedure includes a greedy iterative procedure.
4. The process of claim 1 , wherein the determination of the location is based on an effect of the particular location on a maximum number of outputs of the circuit.
5. The process of claim 1 , wherein the fault analysis determines an impact of a location on the outputs of the circuit.
6. The process of claim 1 , wherein the determination further includes determining a further location to insert the gate based on the particular location and an effect of the further location on the maximum number of the outputs.
7. The process of claim 1 , wherein the determination is at least partially based on at least one of a Hamming Distance or an Avalanche Criterion.
8. The process of claim 1 , wherein the at least one gate includes at least one of a multiplexer, an XOR gate, or an XNOR gate.
9. The process of claim 1 , wherein the at least one gate is configured to corrupt a functionality of the circuit upon an application of an incorrect key.
10. The process of claim 1 , wherein the determination is based on a previous insertion of at least one gate.
11. A non-transitory computer-readable medium including instructions thereon that are accessible by a hardware processing arrangement, wherein, when the processing arrangement executes the instructions, the processing arrangement is configured to perform procedures comprising:
determining at least one location to insert at least one gate in a circuit using a fault analysis procedure that identifies a number of outputs affected by the at least one location; and
inserting the at least one gate, with one input of the at least one gate controlled by at least one key input bit, in at least one section of the at least one location.
12. The computer-readable medium of claim 11 , wherein the determination includes an in iterative procedure.
13. The computer-readable medium of claim 12 , wherein the iterative procedure includes a greedy iterative procedure.
14. The computer-readable medium of claim 11 , wherein the location is based on an effect of the particular location on a maximum number of outputs of the circuit.
15. The computer-readable medium of claim 14 , wherein the fault analysis determines an impact of a location on the outputs of the circuit.
16. The computer-readable medium of claim 11 , wherein the determination further includes determining a further location based on the particular location and an effect of the further location on the maximum number of the outputs.
17. The computer-readable medium of claim 11 , wherein that least one gate includes at least one of a multiplexer, an XOR gate, an XNOR gate, an AND gate, or an OR gate.
18. The computer-readable medium of claim 11 , wherein the determination is at least partially based on at least one of a Hamming Distance or an Avalanche Criterion.
19. The computer-readable medium of claim 11 , wherein the at least one gate is configured to corrupt a functionality of the circuit upon an application of an incorrect key.
20. The computer-readable medium of claim 11 , wherein the determination is based on a previous insertion of at least one gate.
21. A circuit, comprising:
at least one gate provided at a particular location of the circuit determined using a fault analysis procedure that identifies a number of outputs affected by the at least one location, the at least one gate, having one input controlled by at least one key input bit, is configured to corrupt a functionality of the circuit upon an application of an incorrect key.
22. The circuit of claim 21 , wherein the at least one gate includes at least one of a multiplexer, an XOR gate, an XNOR gate, an AND gate, or an OR gate.
23. The circuit of claim 21 , wherein the location is based on an effect of the particular location on a maximum number of outputs of the circuit.
24. The circuit of claim 21 , wherein the determination is at least partially based on at least one of a Hamming Distance or an Avalanche Criterion.