IP Library › Granted Patent US 9,093,356
Granted Patent B2
US 9,093,356 · App. 13/336,667 · Granted Jul 28, 2015

Semiconductor light emitting element

Inventors: Nobuhiko Ubahara (Tokushima, JP); Kouichiroh Deguchi (Tokushima, JP); Takao Yamada (Komatsujima, JP)
Assignee: NICHIA CORPORATION
H01L27/156H01L33/0079H01L33/08H01L33/20H01L33/38H01L33/405
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Quick Facts
Patent No.
US 9,093,356
App. No.
13/336,667
Granted
Jul 28, 2015
Kind
B2
Abstract

A semiconductor light emitting element comprises a semiconductor laminate including a p-type semiconductor layer, an active layer and an n-type semiconductor layer which are sequentially laminated; and a conductive support substrate joined to the p-type semiconductor layer side of the semiconductor laminate. The semiconductor laminate is divided into at least two semiconductor regions by a trench penetrating the p-type semiconductor layer, the active layer and the n-type semiconductor layer.

Claims (40)

1. A semiconductor light emitting element comprising:

a semiconductor laminate including a p-type semiconductor layer, an active layer and an n-type semiconductor layer which are sequentially laminated; and

a conductive support substrate joined to the p-type semiconductor layer side of the semiconductor laminate,

wherein the semiconductor laminate is divided into at least two semiconductor regions by a trench penetrating the p-type semiconductor layer, the active layer and the n-type semiconductor layer,

wherein the semiconductor light emitting element further comprises a continuous junction layer located between the conductive support substrate and the at least two semiconductor regions, at least a portion of the continuous junction layer being in direct contact with the semiconductor laminate of each semiconductor region, and

wherein the semiconductor light emitting element further comprises a reflection layer at a bottom of the trench.

2. The semiconductor light emitting element according to claim 1 , wherein at least a portion of the reflection layer is disposed between the support substrate and the semiconductor laminate.

3. The semiconductor light emitting element according to claim 1 , further comprising an insulating protective layer between the support substrate and the semiconductor laminate.

4. The semiconductor light emitting element according to claim 3 , wherein the protective layer is also disposed at the bottom of the trench.

5. The semiconductor light emitting element according to claim 3 , wherein the protective layer is formed of a dielectric multilayered film.

6. The semiconductor light emitting element according to claim 3 , wherein said at least a portion of the continuous junction layer is in direct contact with each semiconductor region via respective through holes located in the insulating protective layer.

7. The semiconductor light emitting element according to claim 6 , wherein the insulating protective layer is configured to reflect light emitted by the at least two semiconductor regions.

8. The semiconductor light emitting element according to claim 1 , wherein

an insulating protective layer and the reflection layer are sequentially disposed in that order from the support substrate side between the support substrate and the semiconductor laminate, and

wherein the protective layer is also disposed at the bottom of the trench.

9. The semiconductor light element according to claim 8 , wherein the protective layer is formed of a dielectric multilayered film.

10. The semiconductor light emitting element according to claim 1 , wherein the trench has a width of 3 to 25 μm.

11. The semiconductor light emitting element according to claim 1 , wherein:

a top view shape of the semiconductor light emitting element is rectangular, and

a ratio of a length of a side of the rectangular semiconductor light emitting element to a width of a trench extending in direction perpendicular to the side is 100:25 to 100:0.28.

12. The semiconductor light emitting element according to claim 1 , further comprising:

an n-side pad for wire bonding disposed over each n-type semiconductor layer of the semiconductor regions,

wherein each of the n-side pads is disposed adjacent to a side of each of the corresponding semiconductor regions.

13. The semiconductor light emitting element according to claim 12 , wherein

the semiconductor regions are disposed such that at least one side of each of the semiconductor regions is disposed at an outer periphery of the semiconductor light emitting element, and

each of the n-side pads is disposed adjacent to the at least one side of each of the semiconductor regions that is disposed at the outer periphery of the semiconductor light emitting element.

14. The semiconductor light emitting element according to claim 1 , wherein a ratio of a thickness of the p-type semiconductor layer to a thickness of the n-type semiconductor layer is 1:50 to 1:3.

15. The semiconductor light emitting element according to claim 1 , wherein a surface of the n-type semiconductor layer is roughened.

16. The semiconductor light emitting element according to claim 1 ,

wherein a top view shape of the semiconductor light emitting element is rectangular,

wherein a ratio of a length of a side of the rectangular semiconductor light emitting element to a width of a trench extending in direction perpendicular to the side is 100:25 to 100:0.28, and

wherein a ratio of a thickness of the p-type semiconductor layer to a thickness of the n-type semiconductor layer is 1:50 to 1:3.

17. The semiconductor light emitting element according to claim 16 , further comprising:

an n-side pad for wire bonding disposed over each n-type semiconductor layer of the semiconductor regions,

wherein each of the n-side pads is disposed adjacent to a side of each of the corresponding semiconductor regions,

wherein the semiconductor regions are disposed such that at least one side of each of the semiconductor regions is disposed at an outer periphery of the semiconductor light emitting element, and

wherein each of the n-side pads is disposed adjacent to the at least one side of each of the semiconductor regions that is disposed at the outer periphery of the semiconductor light emitting element.

18. The semiconductor light emitting element according to claim 1 , further comprising an insulating protective layer disposed at the bottom of the trench, the insulating protective layer being formed of a dielectric multilayered film.

19. The semiconductor light emitting element according to claim 1 , further comprising a reflection layer disposed at the bottom of the trench, the reflection layer being formed of a metal film.

20. The semiconductor light emitting element according to claim 1 , wherein each semiconductor region consists of the divided semiconductor laminate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 27, 2011
From: UBAHARA, NOBUHIRO; DEGUCHI, KOUICHIROH
To: NICHIA CORPORATION
Reel/Frame 027446/0186 →
Priority Claims (1)
JP 2010-294304 · Dec 28, 2010 · national
Continuity (1)
Related Publication 20120161183A1 · Jun 28, 2012