Classifying flash devices using ECC
An embodiment is a technique to classify a flash device. Test data to a flash device are accessed in unscramble and scramble modes under a test mode. Error correcting code (ECC) results are recorded on the test data for the unscramble and scramble modes. A device quality figure is calculated based on the ECC results for the unscramble and scramble modes. The flash device is classified using the device quality figure.
1. A method comprising:
accessing test data to a flash device in unscramble and scramble modes under a test condition;
recording error correcting code (ECC) results on the test data for the unscramble and scramble modes;
calculating a quality figure based on the ECC results for the unscramble and scramble modes; and
classifying the flash device using the quality figure.
2. The method of claim 1 wherein accessing the test data to the flash device comprises:
enabling scrambling on a flash controller for the scramble mode, the flash controller having interface to the flash device;
disabling scrambling on the flash controller for the unscramble mode; and
accessing the test data to the flash device via the flash controller.
3. The method of claim 2 wherein the test condition includes at least one of a temperature condition and a program/erase (P/E) cycle condition.
4. The method of claim 3 wherein the temperature condition is one of a low temperature, an average temperature, and a high temperature.
5. The method of claim 3 wherein the P/E cycle condition is one of a low P/E cycle, an average P/E cycle, and a high P/E cycle.
6. The method of claim 1 wherein accessing the test data to the flash device comprises:
writing the test data to the flash device via a flash controller; and
reading the test data from the flash device via a flash controller.
7. The method of claim 1 wherein recording the ECC results comprises:
recording at least one of a maximum number of ECCs, a minimum number of ECCs, an average number of ECCs, and a total number of ECCs and the corresponding test condition.
8. The method of claim 1 wherein calculating a quality figure comprises:
determining a dissimilarity measure of the ECC results between the unscramble and scramble modes; and
applying a function on the dissimilarity measure of the ECC results to generate the device quality figure.
9. The method of claim 1 wherein classifying the flash device comprises:
performing a comparison of the quality figure with at least a classification threshold; and
assigning a class to the flash device according to result of the comparison.
10. The method of claim 1 wherein classifying the flash device comprises:
performing a cluster analysis on a group of flash devices having quality figures; and
assigning a class to the flash device based on result of the cluster analysis.
11. An apparatus comprising:
a processor; and
a memory coupled to the processor, the memory having instructions that, when executed, cause the processor to perform operations comprising:
accessing test data to a flash device in unscramble and scramble modes under a test condition,
recording error correcting code (ECC) results on the test data for the unscramble and scramble modes,
calculating a quality figure based on the ECC results for the unscramble and scramble modes, and
classifying the flash device using the quality figure.
12. The apparatus of claim 11 wherein the instructions causing the processor to perform accessing the test data to the flash device comprise instructions that cause the processor to perform operations comprising:
enabling scrambling on a flash controller for the scramble mode, the flash controller having interface to the flash device;
disabling scrambling on the flash controller for the unscramble mode; and
accessing the test data to the flash device via a flash controller.
13. The apparatus of claim 12 wherein the test condition includes at least one of a temperature condition and a program/erase (P/E) cycle condition.
14. The apparatus of claim 13 wherein the temperature condition is one of a low temperature, an average temperature, and a high temperature.
15. The apparatus of claim 13 wherein the P/E cycle condition is one of a low P/E cycle, an average P/E cycle, and a high P/E cycle.
16. The apparatus of claim 11 wherein the instructions causing the processor to perform accessing the test data to the flash device comprise instructions that cause the processor to perform operations comprising:
writing the test data to the flash device via a flash controller; and
reading the test data from the flash device via a flash controller.
17. The apparatus of claim 11 wherein the instructions causing the processor to perform recording the ECC results comprise instructions that cause the processor to perform operations comprising:
recording at least one of a maximum number of ECCs, a minimum number of ECCs, an average number of ECCs, and a total number of ECCs and the corresponding test condition.
18. The apparatus of claim 11 wherein the instructions causing the processor to perform calculating a quality figure comprise instructions that cause the processor to perform operations comprising:
determining a dissimilarity measure of the ECC results between the unscramble and scramble modes; and
applying a function on the dissimilarity measure of the ECC results to generate the quality figure.
19. The apparatus of claim 11 wherein the instructions causing the processor to perform classifying the flash device comprise instructions that cause the processor to perform operations comprising:
performing a comparison of the quality figure with at least a classification threshold; and
assigning a class to the flash device according to result of the comparison.
20. The apparatus of claim 11 wherein the instructions causing the processor to perform classifying the flash device comprise instructions that cause the processor to perform operations comprising:
performing a cluster analysis on a group of flash devices having quality figures; and
assigning a class to the flash device based on result of the cluster analysis.