IP Library Granted Patent US 9,106,246
Granted Patent B2
US 9,106,246 · App. 14/580,181 · Granted Aug 11, 2015

Successive approximation register analog-to-digital converter and associated control method

Inventor: Jun Yang (Suzhou, CN)
Assignee: Realtek Semiconductor Corp.
H03M1/1028H03M1/38H03M1/403H03M1/442
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Quick Facts
Patent No.
US 9,106,246
App. No.
14/580,181
Granted
Aug 11, 2015
Kind
B2
Abstract

The present invention provides a successive approximation register analog-to-digital converter (SAR ADC), where a high bit capacitor of the SAR ADC is composed of a plurality of sub-capacitors, and these sub-capacitors are calibrated when the SAR ADC is working. Therefore, the working speed of the SAR ADC will not be influenced. In addition, a capacitance of each sub-capacitor is lower than a redundant capacitance of the SAR ADC, therefore, input signals of the SAR ADC are allowed to have full swing.

Claims (31)

1. A successive approximation register analog-to-digital converter (SAR ADC), comprising:

a first bit capacitor array, for receiving a first input signal, wherein the first bit capacitor array comprises a plurality of first bit capacitors, and at least one of high first bit capacitors is composed of a plurality of sub-capacitors, and each sub-capacitor is selectively connected to a first reference voltage, a second reference voltage or a common voltage via its corresponding switch;

a second bit capacitor array, for receiving a second input signal, wherein the second bit capacitor array includes a plurality of second bit capacitors, and at least one of high second bit capacitors is composed of a plurality of sub-capacitors, and each sub-capacitor is selectively connected to the first reference voltage, the second reference voltage or the common voltage via its corresponding switch;

a comparator, coupled to the first bit capacitor array and the second bit capacitor array, for comparing outputs of the first bit capacitor array and the second bit capacitor array to generate a comparison signal; and

a processing circuit, coupled to the comparator, for controlling capacitor-switching operations of the first bit capacitor array and the second bit capacitor array to generate a digital output of the SAR ADC;

wherein during a period that the SAR ADC receives the first input signal and the second input signal to generate the digital output, the processing circuit calibrates the sub-capacitors of at least one of the high first bit capacitors of the first bit capacitor array to generate a plurality of weight values of the sub-capacitors, and the processing circuit determines a weight value of the at least one of the high first bit capacitors of the first bit capacitor array according to the weight values of the sub-capacitors; and the processing circuit calibrates the sub-capacitors of at least one of the high second bit capacitors of the second bit capacitor array to generate a plurality of weight values of the sub-capacitors, and the processing circuit determines a weight value of the at least one of the high second bit capacitors of the second bit capacitor array according to the weight values of the sub-capacitors.

2. The SAR ADC of claim 1 , wherein capacitances of all the sub-capacitors of the one of the high first bit capacitors of the first bit capacitor array are the same.

3. The SAR ADC of claim 1 , wherein the SAR ADC is an N-bit SAR ADC, the first bit capacitors are not binary weighted capacitors; and for each first bit capacitor, its capacitance is not greater than a summation of capacitances of all the lower bit capacitors, and a summation of capacitances of a unit capacitor and all the first bit capacitors is not lower than 2 (N-1) times a capacitance of a least first bit capacitor.

4. The SAR ADC of claim 3 , wherein in the first bit capacitor array, any first bit capacitor whose capacitance is greater than a redundant capacitance is composed of a plurality of sub-capacitors, and a capacitance of each sub-capacitor is less than the redundant capacitance, where the redundant capacitance is a difference between the summation of the capacitances of the unit capacitor and all the first bit capacitors with 2 (N-1) times the capacitance of the least bit capacitor.

5. The SAR ADC of claim 4 , wherein during a period that the SAR ADC receives the first input signal and the second input signal to generate the digital output, the processing circuit calibrates the sub-capacitors of at least one of the high first bit capacitors of the first bit capacitor array to generate a plurality of weight values of the sub-capacitors, and the processing circuit determines a weight value of the at least one of the high first bit capacitors of the first bit capacitor array according to the weight values of the sub-capacitors; and the processing circuit calibrates the sub-capacitors of at least one of the high second bit capacitors of the second bit capacitor array to generate a plurality of weight values of the sub-capacitors, and the processing circuit determines a weight value of the at least one of the high second bit capacitors of the second bit capacitor array according to the weight values of the sub-capacitors.

6. The SAR ADC of claim 1 , wherein the SAR ADC allows the first input signal and the second input signal to have full swing.

7. A method for controlling a successive approximation register analog-to-digital converter (SAR ADC), wherein the SAR ADC comprises:

a first bit capacitor array, for receiving a first input signal, wherein the first bit capacitor array comprises a plurality of first bit capacitors, and at least one of high first bit capacitors is composed of a plurality of sub-capacitors, and each sub-capacitor is selectively connected to a first reference voltage, a second reference voltage or a common voltage via its corresponding switch; and

a second bit capacitor array, for receiving a second input signal, wherein the second bit capacitor array includes a plurality of second bit capacitors, and at least one of high second bit capacitors is composed of a plurality of sub-capacitors, and each sub-capacitor is selectively connected to the first reference voltage, the second reference voltage or the common voltage via its corresponding switch; and

the method comprises:

comparing outputs of the first bit capacitor array and the second bit capacitor array to generate a comparison signal;

determining weight values of each first bit capacitors or each second bit capacitors according to the comparison signal;

generating a digital output of the SAR ADC according to the comparison signal and the determined weight values;

during a period that the SAR ADC receives the first input signal and the second input signal to generate the digital output, calibrating the sub-capacitors of at least one of the high first bit capacitors of the first bit capacitor array to generate a plurality of weight values of the sub-capacitors, and determining a weight value of the at least one of the high first bit capacitors of the first bit capacitor array according to the weight values of the sub-capacitors; and

calibrating the sub-capacitors of at least one of the high second bit capacitors of the second bit capacitor array to generate a plurality of weight values of the sub-capacitors, and the determining a weight value of the at least one of the high second bit capacitors of the second bit capacitor array according to the weight values of the sub-capacitors.

8. The method of claim 7 , wherein capacitances of all the sub-capacitors of the one of the high first bit capacitors of the first bit capacitor array are the same.

9. The method of claim 7 , wherein the SAR ADC is an N-bit SAR ADC, the first bit capacitors are not binary weighted capacitors; and for each first bit capacitor, its capacitance is not greater than a summation of capacitances of all the lower bit capacitors, and a summation of capacitances of a unit capacitor and all the first bit capacitors is not lower than 2 (N-1) times a capacitance of a least first bit capacitor.

10. The method of claim 9 , wherein in the first bit capacitor array, any first bit capacitor whose capacitance is greater than a redundant capacitance is composed of a plurality of sub-capacitors, and a capacitance of each sub-capacitor is less than the redundant capacitance, where the redundant capacitance is a difference between the summation of the capacitances of the unit capacitor and all the first bit capacitors with 2 (N-1) times the capacitance of the least bit capacitor.

11. The method of claim 7 , wherein each of the first input signal and the second input signal is allowed to have full swing.

12. A successive approximation register analog-to-digital converter (SAR ADC), comprising:

a first bit capacitor array, for receiving a first input signal, wherein the first bit capacitor array comprises a plurality of first bit capacitors, and at least one of high first bit capacitors is composed of a plurality of sub-capacitors;

a second bit capacitor array, for receiving a second input signal, wherein the second bit capacitor array includes a plurality of second bit capacitors, and at least one of high second bit capacitors is composed of a plurality of sub-capacitors;

a comparator, coupled to the first bit capacitor array and the second bit capacitor array, for comparing outputs of the first bit capacitor array and the second bit capacitor array to generate a comparison signal; and

a processing circuit, coupled to the comparator, for controlling capacitor-switching operations of the first bit capacitor array and the second bit capacitor array to generate an N-bit digital output of the SAR ADC;

wherein in the first bit capacitor array, any first bit capacitor whose capacitance is greater than a redundant capacitance is composed of a plurality of sub-capacitors, and a capacitance of each sub-capacitor is less than the redundant capacitance, where the redundant capacitance is a difference between a summation of capacitances of a unit capacitor and all the first bit capacitors with 2 (N-1) times a capacitance of a least bit capacitor.

13. The SAR ADC of claim 12 , wherein the first bit capacitors are not binary weighted capacitors; and for each first bit capacitor, its capacitance is not greater than a summation of capacitances of all the lower bit capacitors, and the summation of the capacitances of the unit capacitor and all the first bit capacitors is not lower than 2 (N-1) times the capacitance of the least first bit capacitor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 22, 2014
From: YANG, JUN
To: REALTEK SEMICONDUCTOR CORP.
Reel/Frame 034572/0662 →
Priority Claims (1)
CN 2013 1 0721644 · Dec 24, 2013 · national
Continuity (1)
Related Publication 20150180498A1 · Jun 25, 2015