IP Library › Granted Patent US 9,116,353
Granted Patent B2
US 9,116,353 · App. 12/560,211 · Granted Aug 25, 2015

Microscope device

Inventor: Hiroyuki Sangu (Musashino, JP)
Assignee: YOKOGAWA ELECTRIC CORPORATION
G02B21/16G02B21/008G02B21/0076G02B21/06G02B21/14
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Quick Facts
Patent No.
US 9,116,353
App. No.
12/560,211
Granted
Aug 25, 2015
Kind
B2
Abstract

With a microscope device according to the invention, it is possible to acquire information on a deeper part of a living organism than that in the case of a conventional microscope device. The microscope device according to a first invention comprises an illumination optical system for irradiating an object with illumination rays in a line-like form, a detection optical system for receiving light rays generated by the illumination rays. The second invention relates to a microscope device wherein an objective lens of an illumination optical system, and an objective lens of a detection optical system are at respective positions. The third invention relates to a microscope device wherein a separation filter is structured such that a laser beam can pass through only a part (a region) thereof. The fourth invention relates to a microscope device wherein illumination rays having coherence are separated into two portions.

Claims (20)

1. A microscope device, comprising:

a laser beam source that outputs illumination rays;

a modulator disposed in front of the laser beam source and configured to separate the illumination rays output from the laser beam source into at least two portions, and to modulate at least one of the at least two portions of the illumination rays;

objective lenses disposed ahead of the modulator and configured to guide the at least two portions of the illumination rays such that respective optical paths overlap each other on a specimen;

a detection means for detecting feedback light rays generated by interference light occurring in a region where the respective optical paths overlap each other; and

a control device configured to receive a signal from the detection means and control the modulator, wherein

the specimen is irradiated with the at least two portions of the illumination rays,

the detection means detects the feedback light rays emitted from the specimen based on the at least two portions of the illumination rays,

optical paths of the at least two portions of the illumination rays between the respective objective lenses and a focal point are separated from each other so as not to overlap each other,

the feedback light rays are fluorescent rays, and the detection means detects the fluorescent rays generated by the interference light,

the detecting means comprises an optical detector and a band-pass filter,

a signal is delivered to the band-pass filter from the optical detector, and

modulations at given frequencies differing from each other are applied to at least two portions of the illumination rays, and intensity modulation varying at a sum of, or a difference between at least two frequencies is induced by the interference light occurring at a focal point on the specimen.

2. The microscope device according to claim 1 , wherein

the objective lenses cause the at least two portions of the illumination rays to form only one focal point on the specimen, and

the detection means acquires the feedback light rays generated by an interference light occurring at the only one focal point via the objective lenses for detection.

3. The microscope device according to claim 1 , wherein the modulation is any of phase modulation, intensity modulation, and frequency modulation, a signal of the light rays generated by the interference light is acquired, and a frequency component corresponding to the sum of, or the difference between the at least two frequencies is extracted.

4. The microscope device according to claim 1 , wherein at least two portions of the illumination rays fall on the objective lenses, respectively, as parallel rays, each being light rays smaller in size than a diameter of a pupil of the objective lens at a pupil position of the objective lens where no overlapping occurs.

5. The microscope device according to claim 1 , wherein a region where the illumination rays overlap each other is scanned, and the detection means detects the feedback light rays from the respective focal points is scanned.

6. The microscope device according to claim 1 , wherein the band-pass filter is an electrical band-pass filter.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 16, 2009
From: SANGU, HIROYUKI
To: YOKOGAWA ELECTRIC CORPORATION
Reel/Frame 023242/0824 →
Priority Claims (6)
JP 2008-235946 · Sep 16, 2008 · national
JP 2008-235947 · Sep 16, 2008 · national
JP 2008-235948 · Sep 16, 2008 · national
JP 2008-235950 · Sep 16, 2008 · national
JP 2009-017476 · Jan 29, 2009 · national
JP 2009-145341 · Jun 18, 2009 · national
Continuity (1)
Related Publication 20100067103A1 · Mar 18, 2010