IP Library Granted Patent US 9,123,717
Granted Patent B2
US 9,123,717 · App. 13/954,833 · Granted Sep 1, 2015

Semiconductor device manufacturing method and manufacturing apparatus

Inventors: Kenro Nakamura (Oita, JP); Mitsuyoshi Endo (Yamato, JP); Kazuyuki Higashi (Oita, JP); Takashi Shirono (Oita, JP)
Assignee: KABUSHIKI KAISHA TOSHIBA
H01L25/50H01L21/561H01L21/6715H01L21/67092H01L23/3178H01L23/3185H01L24/94H01L21/6836H01L24/80H01L24/83H01L2221/68327H01L2224/08146H01L2224/2919H01L2224/32145H01L2224/75744H01L2224/80006H01L2224/80123H01L2224/80129H01L2224/83005H01L2224/83123H01L2224/83129H01L2224/94H01L2225/06541
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Quick Facts
Patent No.
US 9,123,717
App. No.
13/954,833
Granted
Sep 1, 2015
Kind
B2
Abstract

According to one embodiment, a semiconductor device manufacturing method includes: bonding a first wafer and a second wafer to each other, to form a stack; rubbing a film attached with a fill material in a thin-film shape into a gap located between a bevel of the first wafer and a bevel of the second wafer, to fill the gap with the fill material; and thinning the first wafer.

Claims (10)

1. A semiconductor device manufacturing method, the method comprising:

bonding a first wafer and a second wafer to each other, to form a stack;

pressing a first film attached with a fill material in a thin-film shape against a gap located between a bevel of the first wafer and a bevel of the second wafer, to fill the gap with the fill material;

removing residual fill material that extends off the gap by use of a second film after filling the gap with the fill material; and

thinning the first wafer.

2. The semiconductor device manufacturing method according to claim 1 , further comprising forming a through electrode in at least one wafer out of the first wafer and the second wafer before formation of the stack.

3. The semiconductor device manufacturing method according to claim 1 , further comprising rotating the stack during at least one of the filling the gap with the fill material and the removing the residual material.

4. The semiconductor device manufacturing method according to claim 1 , wherein a material containing a glass material, an inorganic polymer or an organic polymer is used as the fill material.

5. The semiconductor device manufacturing method according to claim 1 , further comprising performing a treatment to cure the fill material after filling the gap with the fill material.

6. The semiconductor device manufacturing method according to claim 5 , wherein the treatment to cure the fill material is a drying treatment, a heating treatment, or a light irradiation treatment.

Assignments (5)
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
MERGER Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 24, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043709/0035 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 30, 2013
From: NAKAMURA, KENRO; ENDO, MITSUYOSHI; HIGASHI, KAZUYUKI; SHIRONO, TAKASHI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 030909/0217 →
Priority Claims (1)
JP 2013-039025 · Feb 28, 2013 · national
Continuity (1)
Related Publication 20140242779A1 · Aug 28, 2014