Multi-spectral imaging system and method of surface inspection therewith

1. A multi-spectral imaging system for inspecting a surface of a manufactured mechanical component, comprising: comprising:

a first light source that directs a first beam light having a first wavelength onto the surface;

a second light source that directs a second beam of light having a second wavelength different from said first wavelength onto the surface;

a camera having a lens, a beam splitter downstream of the lens and a pair of sensors downstream of said beam splitter, said beam splitter passing the first beam of light through said beam splitter and reflecting the second beam of light off said beam splitter, and first one of said pair of sensors being receiving said first beam of light from said first light source to produce one image and a second one of said pair of sensors receiving said second beam of light from said second light source to produce another image different from said one image;

a transfer device that moves the component while the first and second beams of light reflect off the surface being inspected; and

wherein at least one of said sensors moves toward and away from said beam splitter.

2. The multi-spectral imaging system of claim 1 wherein said first light source emits visible light and said light source emits infrared light.

3. The multi-spectral imaging system of claim 2 wherein said sensor receiving said visible light processes a range of 5-15 frames per second and said sensor receiving said infrared light processes a range of 150-200 frames per second.

4. The multi-spectral imaging system of claim 1 further including at least one processor, said pair of sensors being in communication with said processor.

5. The multi-spectral imaging system of claim 3 wherein said processor is configured to overlie said one image and said another image with one another.

6. A method of inspecting a surface of a manufactured mechanical component, comprising:

reflecting a first wavelength of light off the surface;

reflecting a second wavelength of light off the surface, the second wavelength being different from the first wavelength;

moving the part while reflecting the first and second wavelengths of light off the surface being inspected;

passing the reflected first wavelength of light through a camera lens;

passing the reflected second wavelength of light through the same camera lens as the first wavelength of light;

reflecting one of the first or second wavelength of light off a beam splitter within the camera and onto a first sensor;

passing the other of the first or second wavelength of light through the beam splitter within the camera and onto a second sensor different from the first sensor; and

moving at least one of the first or second sensors toward and away form the beam splitter to produce a first image of the surface with the first sensor and a second image of the surface with the second sensor, the first image being different from the second image.

7. The method of claim 6 further including emitting one of the first wavelength of light or the second wavelength of light as infrared light and the other of the first wavelength of light or the second wavelength of light as visible light.

8. The method of claim 6 further including configuring at least one processor in communication with the first and second sensors and overlying the first image and the second image with one another with the processor.

9. The method of claim 8 further including mirroring one of the first image or the second image prior to the overlying the first image and the second image with one another.

10. The method of claim 6 further including configuring one of the first sensor or second sensor to process a range 5-15 frames per second and the other of the first sensor or the second sensor to process a range 150-200 frames per second.

11. The method of claim 6 further including reflecting the first wavelength of light and the second wavelength of light off the surface at the same time.