Semiconductor device with chip having a different number of front surface electrodes and back surface electrodes

1. A semiconductor device comprising:

a wiring board having a first surface and a second surface opposite to the first surface;

a first semiconductor chip having a first front surface, a plurality of first front surface electrodes formed on the first front surface, a first back surface opposite to the first front surface, and a plurality of back surface electrodes formed on the first back surface and electrically connected to the first front surface electrodes, respectively, the first back surface electrodes being formed at positions overlapping the first front surface electrodes in a plan view, respectively, the first semiconductor chip being mounted over the first surface of the wiring board such that the first front surface faces the first surface of the wiring board;

a second semiconductor chip having a second front surface, a plurality of second front surface electrodes formed on the second front surface and electrically connected to the first back surface electrodes, respectively, a second back surface opposite to the second front surface, and a plurality of second back surface electrodes formed on the second back surface and electrically connected to the second front surface electrodes, respectively, a plurality of through silicon vias penetrating from one of the second front surface and the second back surface to the other, and a plurality of lead wirings formed on the second front surface or the second back surface and electrically connecting the through silicon vias and the second front surface electrodes or the second back surface electrodes, the second semiconductor chip being mounted over the first back surface of the first semiconductor chip;

a third semiconductor chip having a third front surface, a plurality of third front surface electrodes electrically connected to the second back surface electrodes, respectively, and a third back surface opposite to the third front surface, the third semiconductor chip being mounted over the second semiconductor chip such that the third front surface faces the second semiconductor chip; and

a plurality of external terminals formed on the second surface of the wiring board,

wherein the third semiconductor chip has a planar size larger than a planar size of the first semiconductor chip,

wherein a first circuit is formed in the third semiconductor chip,

wherein a first control circuit for controlling driving of the first circuit is formed in the first semiconductor chip,

wherein a second control circuit for controlling driving of the first circuit is formed in the second semiconductor chip, and

wherein a number of the second front surface electrodes of the second semiconductor chip is smaller than a number of the second back surface electrodes.

2. The semiconductor device according to claim 1 , wherein the plurality of third front surface electrodes of the third semiconductor chip are disposed in a center portion of the third front surface.

3. The semiconductor device according to claim 2 ,

wherein the plurality of second back surface electrodes of the second semiconductor chip is disposed at positions overlapping the plurality of third front surface electrodes of the third semiconductor chip in the thickness direction and also electrically connected to the plurality of third front surface electrodes, and

wherein the plurality of first back surface electrodes of the first semiconductor chip is disposed at positions overlapping the second front surface electrodes of the second semiconductor chip in the thickness direction.

4. The semiconductor device according to claim 1 ,

wherein a planar size of the second semiconductor chip is larger than a planar size of the first semiconductor chip.

5. The semiconductor device according to claim 4 ,

wherein, in a plan view, a side surface of the second semiconductor chip is positioned between a side surface of the first semiconductor chip and a side surface of the third semiconductor chip.

6. The semiconductor device according to claim 1 ,

wherein a power circuit for supplying power for driving the first circuit is formed in the third semiconductor chip, and

wherein a power front surface electrode for supplying power to the power circuit among the plurality of second front surface electrodes and a power back surface electrode for supplying power to the power circuit among the plurality of second back surface electrodes are disposed at positions overlapping in a thickness direction.

7. The semiconductor device according to claim 1 ,

wherein a second control circuit for increasing communication frequency is formed in the second semiconductor chip.

8. The semiconductor device according to claim 1 ,

wherein a main memory circuit is formed in the third semiconductor chip, and

wherein in the first semiconductor chip, a first control circuit for controlling driving of the main memory circuit, and a computing circuit for performing arithmetic processing on signal data inputted and outputted to and from the third semiconductor chip or an external device are formed.

9. A semiconductor device comprising:

a wiring board having a first surface and a second surface opposite to the first surface;

a first semiconductor chip having a first front surface, a plurality of first front surface electrodes formed on the first front surface, a first back surface opposite to the first front surface, and a plurality of back surface electrodes formed on the first back surface and electrically connected to the first front surface electrodes, respectively, the first back surface electrodes being formed at positions overlapping the first front surface electrodes in a plan view, respectively, the first semiconductor chip being mounted over the first surface of the wiring board such that the first front surface faces the first surface of the wiring board;

a second semiconductor chip having a second front surface, a plurality of second front surface electrodes formed on the second front surface and electrically connected to the first back surface electrodes, respectively, a second back surface opposite to the second front surface, and a plurality of second back surface electrodes formed on the second back surface and electrically connected to the second front surface electrodes, respectively, a plurality of through silicon vias penetrating from one of the second front surface and the second back surface to the other, and a plurality of lead wirings formed on the second front surface or the second back surface and electrically connecting the through silicon vias and the second front surface electrodes or the second back surface electrodes, the second semiconductor chip being mounted over the first back surface of the first semiconductor chip;

a third semiconductor chip having a third front surface, a plurality of third front surface electrodes electrically connected to the second back surface electrodes, respectively, and a third back surface opposite to the third front surface, the third semiconductor chip being mounted over the second semiconductor chip such that the third front surface faces the second semiconductor chip; and

a plurality of external terminals formed on the second surface of the wiring board,

wherein the third semiconductor chip has a planar size larger than a planar size of the first semiconductor chip,

wherein a first circuit is formed in the third semiconductor chip,

wherein a first control circuit for controlling driving of the first circuit is formed in the first semiconductor chip,

wherein a second control circuit for increasing communication frequency is formed in the second semiconductor chip, and

wherein a number of the second front surface electrodes of the second semiconductor chip is smaller than a number of the second back surface electrodes.

10. The semiconductor device according to claim 9 , wherein the plurality of third front surface electrodes of the third semiconductor chip are disposed in a center portion of the third front surface.

11. The semiconductor device according to claim 10 ,

wherein the plurality of second back surface electrodes of the second semiconductor chip is disposed at positions overlapping the plurality of third front surface electrodes of the third semiconductor chip in the thickness direction and also electrically connected to the plurality of third front surface electrodes, and

wherein the plurality of first back surface electrodes of the first semiconductor chip is disposed at positions overlapping the second front surface electrodes of the second semiconductor chip in the thickness direction.

12. The semiconductor device according to claim 9 ,

wherein a planar size of the second semiconductor chip is larger than a planar size of the first semiconductor chip.

13. The semiconductor device according to claim 12 ,

wherein, in a plan view, a side surface of the second semiconductor chip is positioned between a side surface of the first semiconductor chip and a side surface of the third semiconductor chip.

14. The semiconductor device according to claim 9 ,

wherein a power circuit for supplying power for driving the first circuit is formed in the third semiconductor chip, and

wherein a power front surface electrode for supplying power to the power circuit among the plurality of second front surface electrodes and a power back surface electrode for supplying power to the power circuit among the plurality of second back surface electrodes are disposed at positions overlapping in a thickness direction.

15. The semiconductor device according to claim 9 ,

wherein a main memory circuit is formed in the third semiconductor chip, and

wherein in the first semiconductor chip, a first control circuit for controlling driving of the main memory circuit, and a computing circuit for performing arithmetic processing on signal data inputted and outputted to and from the third semiconductor chip or an external device are formed.