IP Library › Granted Patent US 9,129,860
Granted Patent B2
US 9,129,860 · App. 14/142,138 · Granted Sep 8, 2015

Semiconductor device and manufacturing method thereof

Inventors: Yoshiaki Fukuzumi (Yokkaichi, JP); Hideaki Aochi (Yokkaichi, JP)
Assignee: KABUSHIKI KAISHA TOSHIBA
H01L27/11582G11C16/0483H01L27/1157H01L27/2481
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Quick Facts
Patent No.
US 9,129,860
App. No.
14/142,138
Granted
Sep 8, 2015
Kind
B2
Abstract

In this embodiment, a mask material is formed above a film to be processed, and a plurality of sacrifice films are formed above the mask material, each of the sacrifice films having a columnar shape. Then, a sidewall film is formed on a sidewall of the sacrifice films, and then the sacrifice films are removed. Thereafter, the sidewall films are caused to flow. In addition, a plurality of holes are formed in the mask material using the sidewall film as a mask. Then, isotropic etching is performed for the mask material to etch back the sidewall of the mask material with respect to a sidewall of the sidewall film by a first distance. Thereafter, a deposition layer is deposited inside the plurality of holes to close an opening of the plurality of holes with the deposition layer. Anisotropic etching is conducted to remove the deposition layer in the opening.

Claims (15)

1. A semiconductor device, comprising:

a stacked body where conductive films and insulating films are alternately laminated in a stacking direction;

a plurality of first holes formed in the stacked body and arranged in a zigzag manner in a planar direction of the stacked body; and

a plurality of second holes formed in the stacked body and arranged in a zigzag manner in a planar direction of the stacked body, and formed in positions sandwiched between the first holes,

the first holes and the second holes each have a substantially equal diameter,

the first holes and the second holes are different from each other in number thereof in a direction perpendicular to the stacking direction.

2. The semiconductor device according to claim 1 , wherein

the first hole and the second hole each have a different shape.

3. The semiconductor device according to claim 1 , wherein

the number of the first hole is larger than the number of the second hole.

4. A semiconductor device, comprising:

a stacked body where conductive films and insulating films are alternately laminated in a stacking direction;

a plurality of first holes formed in the stacked body and arranged in a first direction perpendicular to the stacking direction; and

a plurality of second holes formed in the stacked body and arranged away from the first holes in a second direction perpendicular to both the stacking direction and the first direction,

wherein the first holes positioned at an edge of the first direction and the second holes positioned at an edge of the first direction are arranged in the second direction in a zigzag manner.

Assignments (5)
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
MERGER Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 24, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043709/0035 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 27, 2013
From: FUKUZUMI, YOSHIAKI; AOCHI, HIDEAKI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 031854/0270 →
Priority Claims (1)
JP 2013-061638 · Mar 25, 2013 · national
Continuity (1)
Related Publication 20140284607A1 · Sep 25, 2014