Inspection apparatus
An inspection apparatus capable of facilitating reduction in cost of the apparatus is provided. The inspection apparatus includes: beam generation means for generating any of charged particles and electromagnetic waves as a beam; a primary optical system that guides the beam into an inspection object held on a movable stage in a working chamber and irradiates the inspection object with the beam; a secondary optical system that detects secondary charged particles occurring from the inspection object; and an image processing system that forms an image on the basis of the detected secondary charged particles. The inspection apparatus further includes: a linear motor that drives the movable stage; and a Helmholtz coil that causes a magnetic field for canceling a magnetic field caused by the linear motor when the movable stage is driven.
1. An inspection apparatus, comprising:
beam generation means for generating any of charged particles and electromagnetic waves as a beam;
a primary optical system that guides the beam into an inspection object held on a movable stage in a working chamber and irradiates the inspection object with the beam;
a secondary optical system that detects secondary charged particles occurring from the inspection object;
an image processing system that forms an image on the basis of the detected secondary charged particles;
a linear motor that drives the movable stage;
a Helmholtz coil that causes a magnetic field for canceling a magnetic field caused by the linear motor when the movable stage is driven;
current detection means for detecting drive current for driving the linear motor; and
magnetic field control means for controlling an intensity of a magnetic field caused by the Helmholtz coil according to the drive current detected by the current detection means.
2. The inspection apparatus according to claim 1 , further comprising
position detection means for detecting a position of the movable stage,
wherein the magnetic field control means controls the intensity of the magnetic field caused by the Helmholtz coil, according to the drive current detected by the current detection means and the position detected by the position detection means.