IP Library › Granted Patent US 9,136,369
Granted Patent B2
US 9,136,369 · App. 14/496,808 · Granted Sep 15, 2015

Semiconductor device

Inventors: Yuki Tanaka (Niiza, JP); Toru Yoshie (Niiza, JP); Mikio Kandori (Niiza, JP); Yusuke Ozawa (Niiza, JP)
Assignee: Sanken Electric Co., LTD.
H01L29/7802H01L29/41741H01L29/41766H01L29/45
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Quick Facts
Patent No.
US 9,136,369
App. No.
14/496,808
Granted
Sep 15, 2015
Kind
B2
Abstract

A semiconductor device includes a semiconductor substrate, a surface of which is provided with: a source region having a first conductivity type is formed in a body region having a second conductivity type opposite to the first conductivity type; a main electrode connected to the source region and the body region; and a gate electrode, to which a voltage for controlling a current flowing through the main electrode is applied, and the semiconductor device includes: a recess formed in the surface of the semiconductor substrate, wherein the source region is exposed on an inner surface of the recess and the main electrode is connected to the source region at the inner surface of the recess.

Claims (21)

1. A semiconductor device comprising:

a semiconductor substrate, a surface of the semiconductor substrate provided with:

a source region having a first conductivity type formed in a body region, the body region having a second conductivity type opposite to the first conductivity type;

a main electrode connected to the source region and the body region; and

a gate electrode, to which a voltage for controlling a current flowing through the main electrode is applied; and

a recess formed in the surface of the semiconductor substrate,

wherein the source region is exposed on an inner surface of the recess, and

wherein the body region and the source region are sequentially formed on the inner surface of the recess and the main electrode is connected to the source region at the inner surface of the recess.

2. The semiconductor device according to claim 1 ,

wherein a body-region-connecting region to which the body region and the main electrode are connected is provided at a position higher than a bottom surface of the recess.

3. The semiconductor device according to claim 2 ,

wherein the gate electrode extends in one direction on the surface of the semiconductor substrate, and

wherein the recess and the body-region-connecting region are alternately provided in a direction parallel with the gate electrode.

4. The semiconductor device according to claim 2 ,

wherein the gate electrode extends in an extending direction on the surface of the semiconductor substrate,

wherein the source region and the body region are formed on the surface of the semiconductor substrate on both sides, in a direction perpendicular to the extending direction, of the gate electrode, and

wherein the recess is formed at one side of the sides of the gate electrode in the direction perpendicular to the extending direction, and the main electrode is connected to the source region formed in the recess.

5. The semiconductor device according to claim 1 ,

wherein a body-region-connecting region to which the body region and the main electrode are connected is provided on a bottom surface of the recess.

6. The semiconductor device according to claim 1 ,

wherein the main electrode and at least one of the source region and the body region are connected to each other through a silicide electrode.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 11, 2014
From: TANAKA, YUKI; YOSHIE, TORU; KANDORI, MIKIO; OZAWA, YUSUKE
To: SANKEN ELECTRIC CO., LTD.
Reel/Frame 034142/0030 →
Priority Claims (1)
JP 2013-204889 · Sep 30, 2013 · national
Continuity (1)
Related Publication 20150091082A1 · Apr 2, 2015