IP Library Granted Patent US 9,151,853
Granted Patent B2
US 9,151,853 · App. 14/074,131 · Granted Oct 6, 2015

Neutron-detecting apparatuses and methods of fabrication

Inventors: Rajendra P. Dahal (Troy, NY); Jacky Kuan-Chih Huang (Troy, NY); James J. Q. Lu (Watervliet, NY); Yaron Danon (Selkirk, NY); Ishwara B. Bhat (Clifton Park, NY)
Assignee: RENSSELAER POLYTECHNIC INSTITUTE
G01T3/08G01T3/00H01L27/1428H01L31/02161H01L31/03529H01L31/115
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Quick Facts
Patent No.
US 9,151,853
App. No.
14/074,131
Granted
Oct 6, 2015
Kind
B2
Abstract

Neutron-detecting structures and methods of fabrication are provided which include: a substrate with a plurality of cavities extending into the substrate from a surface; a p-n junction within the substrate and extending, at least in part, in spaced opposing relation to inner cavity walls of the substrate defining the plurality of cavities; and a neutron-responsive material disposed within the plurality of cavities. The neutron-responsive material is responsive to neutrons absorbed for releasing ionization radiation products, and the p-n junction within the substrate spaced in opposing relation to and extending, at least in part, along the inner cavity walls of the substrate reduces leakage current of the neutron-detecting structure.

Claims (16)

1. An apparatus comprising:

a neutron-detecting structure, the neutron-detecting structure comprising:

a substrate comprising a plurality of cavities extending into the substrate from a surface thereof;

a p-n junction within the substrate and extending, at least in part, in spaced opposing relation to inner cavity walls of the substrate defining the plurality of cavities therein;

a neutron-responsive material disposed within the plurality of cavities, the neutron-responsive material being responsive to neutrons absorbed thereby for releasing ionizing radiation reaction products, wherein the p-n junction within the substrate spaced in opposing relation to and extending, at least in part, along the inner cavity walls of the substrate reduces leakage current of the neutron-detecting structure;

wherein the p-n junction within the substrate is a continuous p-n junction, the continuous p-n junction being disposed, in part, parallel to the surface of the substrate from which the plurality of cavities extend into the substrate, as well as in spaced opposing relation to the inner cavity walls of the substrate; and

wherein the continuous p-n junction is spaced from the surface of the substrate a greater distance than the continuous p-n junction is spaced in opposing relation to the inner cavity walls of the substrate.

2. The apparatus of claim 1 ,

wherein, in operation, the substrate comprises a depletion region, the depletion region extending within the substrate to at least a depth of the plurality of cavities within the substrate.

3. The apparatus of claim 2 , wherein the depletion region of the substrate resides, at least in part, within an n − region of the substrate, the n − region of the substrate being above an n + region of the substrate.

4. The apparatus of claim 1 , wherein at least one cavity of the plurality of cavities within the substrate is, at least in part, a hexagonal-cross-sectional-shaped cavity.

5. The apparatus of claim 1 , wherein the plurality of cavities are arrayed, at least in part, in a honeycomb pattern within the substrate.

6. The apparatus of claim 1 , further comprising multiple neutron-detecting structures, the neutron-detecting structure being one neutron-detecting structure of the multiple neutron-detecting structures, and wherein the multiple neutron-detecting structures are electrically coupled in series.

7. The apparatus of claim 1 , wherein the neutron-detecting structure is designed to operate at zero bias voltage.

8. The apparatus of claim 1 , wherein the p-n junction extends into the substrate, parallel to the inner cavity walls thereof to at least a depth of a cavity of the plurality of cavities within the substrate.

9. The apparatus of claim 1 , wherein the p-n junction extends into the substrate conformally about the plurality of cavities within the substrate.

Assignments (3)
CONFIRMATORY LICENSE Recorded Feb 6, 2020
From: RENSSELAER POLYTECHNIC INSTITUTE
To: UNITED STATES DEPARTMENT OF ENERGY
Reel/Frame 051835/0958 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 6, 2013
From: DANON, YARON
To: RENSSELAER POLYTECHNIC INSTITUTE
Reel/Frame 031733/0175 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 7, 2013
From: DAHAL, RAJENDRA P.; HUANG, JACKY KUAN-CHIH; LU, JAMES J.Q.; BHAT, ISHWARA B.
To: RENSSELAER POLYTECHNIC INSTITUTE
Reel/Frame 031562/0001 →
Continuity (2)
Provisional Application 61723471 · Nov 7, 2012
Related Publication 20140252520A1 · Sep 11, 2014