IP Library › Granted Patent US 9,153,610
Granted Patent B2
US 9,153,610 · App. 13/741,228 · Granted Oct 6, 2015

Solid-state image sensor

Inventors: Masahiro Kobayashi (Tokyo, JP); Hideaki Takada (Yokohama, JP); Toshiaki Ono (Ebina, JP)
Assignee: Canon Kabushiki Kaisha
H01L27/14601H01L27/14603H01L27/14609H01L27/14621H01L27/14623H01L27/14636H01L27/14645H04N5/335
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Quick Facts
Patent No.
US 9,153,610
App. No.
13/741,228
Granted
Oct 6, 2015
Kind
B2
Abstract

A solid-state image sensor comprising a pixel array in which a plurality of pixels are arrayed in a matrix having a plurality of rows and a plurality of columns, wherein the pixel array includes a first wiring layer and a second wiring layer arranged above the first wiring layer, the first wiring layer includes first column signal lines arranged at the respective columns of the pixel array, and the second wiring layer includes second column signal lines arranged at the respective columns of the pixel array.

Claims (38)

1. A solid-state image sensor including a pixel array in which a plurality of pixels are arrayed in a matrix having a plurality of rows and a plurality of columns, comprising:

a first photoelectric conversion portion provided in a first pixel;

a second photoelectric conversion portion provided in the first pixel;

a third photoelectric conversion portion provided in a second pixel, the second pixel being located in a column in which the first pixel is located and in a row differing from a row in which the first pixel is located;

a fourth photoelectric conversion portion provided in the second pixel;

a first wiring layer including first column signal lines which correspond to each of the respective plurality of columns;

a second wiring layer, arranged above the first wiring layer, including second column signal lines which correspond to each of the respective plurality of columns;

a color filter, corresponding to both the first photoelectric conversion portion and the second photoelectric conversion portion, through which an incident light passes to the first photoelectric conversion portion and the second photoelectric conversion portion; and

a microlens, corresponding to both the first photoelectric conversion portion and the second photoelectric conversion portion, configured to guide an incident light to the first photoelectric conversion portion and the second photoelectric conversion portion, wherein

the first column signal lines include at least two column signal lines for outputting each of signals from the first photoelectric conversion portion and the second photoelectric conversion portion, and

the second column signal lines include at least two column signal lines for outputting each of signals from the third photoelectric conversion portion and the fourth photoelectric conversion portion.

2. The sensor according to claim 1 , wherein

the first wiring layer further includes a conductive shield pattern,

the shield pattern is arranged adjacent to the first column signal lines of the first wiring layer, and

the second column signal lines are arranged at a position shifted from a position immediately above the first column signal lines.

3. The sensor according to claim 2 , wherein a reference potential is supplied to the shield pattern.

4. The sensor according to claim 1 , wherein

the first wiring layer further includes a conductive shield pattern, and

the shield pattern is arranged between the at least two column signal lines in the first wiring layer.

5. The sensor according to claim 4 , wherein

the second wiring layer further includes a second conductive shield pattern, and

the second shield pattern is arranged between the at least two column signal lines in the first wiring layer.

6. The sensor according to claim 4 , wherein a conductive shield pattern is not arranged between the at least two column signal lines in the second wiring layer.

7. The sensor according to claim 1 , wherein

the plurality of pixels are arrayed according to a Bayer arrangement,

the at least two column signal lines of the first column signal lines of the first wiring layer propagate pixel signals of the same color, and

the at least two column signal lines of the second column signal lines of the second wiring layer propagate pixel signals of the same color.

8. The sensor according to claim 1 , wherein

the plurality of pixels are arrayed according to a Bayer arrangement, and

said pixel array includes a portion where the at least two column signal lines of the first column signal lines of the first wiring layer and the at least two column signal lines of the second column signal lines of the second wiring layer propagate pixel signals of the same color.

9. The sensor according to claim 1 , wherein

color filters according to a Bayer arrangement are arranged in the respective pixels,

a signal of a green pixel is read out to at least one of the first column signal lines included in the first wiring layer, and

signals of a red pixel and blue pixel are read out to at least one of the second column signal lines included in the second wiring layer.

10. The sensor according to claim 1 , wherein a signal from the first photoelectric conversion portion and a signal from the second photoelectric conversion portion are used as focus detection signals.

11. A camera comprising:

a solid-state image sensor defined in claim 1 ; and

a processor which processes a signal output from said solid-state image sensor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 15, 2013
From: KOBAYASHI, MASAHIRO; TAKADA, HIDEAKI; ONO, TOSHIAKI
To: CANON KABUSHIKI KAISHA
Reel/Frame 030219/0824 →
Priority Claims (2)
JP 2012-008447 · Jan 18, 2012 · national
JP 2012-281754 · Dec 25, 2012 · national
Continuity (1)
Related Publication 20130182163A1 · Jul 18, 2013