Probe card
It is an object of the present invention to provide a probe card capable of controlling generation of a scratch or an indentation in a connection pad and capable of controlling generation of heat in a connection pad and its vicinity having contacted a contact probe at low cost and in a simple way. A probe card includes a probe substrate, at least one contact probe electrically connected to a signal line provided to an insulating base of the probe substrate and fixed to the insulating base, and at least one engagement member installed on the contact probe at a position near a tip end portion of the contact probe. The engagement member has at least one engagement portion that makes abutting contact with another predetermined member during operation to restrain the operation of the contact probe.
1. A probe card, comprising: a probe substrate: at least one contact probe electrically connected to a signal line provided to an insulating base of said probe substrate and fixed to said insulating base, at least a portion of said contact probe movable with respect to the probe substrate; and at least one engagement member, made of a metallic material, installed on said contact probe at a position near a tip end portion of said contact probe, the engagement member movable with the movement the portion of said contact probe, the engagement member having at least one engagement portion that makes abutting contact with another predetermined member during operation to restrain the operation of said contact probe.
2. The probe card according to claim 1 , wherein said another predetermined member includes a contact probe different from said contact probe on which said engagement member is installed, an engagement member different from said engagement member, or said insulating base.
3. The probe card according to claim 1 , wherein
said contact probe is provided with at least one stepped part or at least one recessed part formed near said tip end portion of an axial portion of said contact probe, and
said engagement member is installed on said contact probe through said stepped part or said recessed part.
4. The probe card according to claim 1 , wherein said contact probe is provided with at least one curved part formed in an axial portion of said contact probe.
5. The probe card according to claim 1 , wherein said engagement member has at least one folded part formed by folding process.
6. The probe card according to claim 1 , wherein said engagement portion is made of an insulating material.
7. The probe card according to claim 1 , wherein
said engagement portion includes an electrical contact formed so as to be exposed from a surface of said engagement portion to make abutting contact with said another predetermined member, and
said electrical contact is capable of contacting an another electrical contact provided to said another predetermined member.
8. The probe card according to claim 1 , wherein said engagement portion further includes a signal output element that outputs a certain signal in response to an abutting condition.
9. The probe card according to claim 1 , wherein said engagement portion is installed on said contact probe so as to contact at least two places of said contact probe.
10. The probe card according to claim 1 , wherein said engagement member is provided with a fin portion on at least one side surface of said engagement member.
11. The probe card according to claim 1 , wherein
said contact probe includes a plurality of contact probes, and
said engagement member is commonly installed on said contact probes.
12. The probe card according to claim 1 , wherein said probe substrate further includes a blast fan provided on a side where said contact probe is installed.