Radiation source, lithographic apparatus and device manufacturing method
A radiation source generates extreme ultraviolet radiation for a lithographic apparatus as a chamber that is provided with a low pressure hydrogen environment. A trace amount of a protective compound, e.g., H 2 O, H 2 O 2 , O 2 , NH 3 or NO x , is provided to the chamber to assist in maintaining a protective oxide film on metal, e.g., titanium, components in the chamber.
1. A radiation source comprising:
a vacuum chamber enclosing a component comprising a non-inert material and enclosing a radiation generating element comprising a fuel;
a gas supply arranged to supply hydrogen to the vacuum chamber; and
a protecting device arranged to supply a trace amount of a protective compound to the vacuum chamber,
wherein the radiation source is configured to supply a beam of extreme ultraviolet radiation to a lithographic apparatus, and
wherein a temperature inside the vacuum chamber, a first partial pressure of the protective compound in the vacuum chamber, and a second partial pressure of hydrogen in the vacuum chamber are such that the protective compound preferentially bonds to the non-inert material rather than hydrogen and are such that the fuel remains in a non-oxidized state inside the vacuum chamber.
2. The radiation source according to claim 1 , wherein the protecting device is arranged to supply a protective compound selected from the group consisting of H 2 O, H 2 O 2 , O 2 , NH 3 , NO x , O 3 , CO 2 and LOX.
3. The radiation source according to claim 1 , wherein the radiation generating element comprises a droplet generator arranged to emit droplets of the fuel and a beam generating device arranged to irradiate the droplets of fuel.
4. The radiation source according to claim 3 , wherein the droplet generator is arranged to generate droplets of liquid tin as the fuel.
5. The radiation source according to claim 1 , wherein the protecting device is arranged to provide the protective compound at a rate such that the first partial pressure of the protective compound in the vacuum chamber is greater than about 10 −4 times the second partial pressure of hydrogen in the vacuum chamber.
6. The radiation source according to claim 1 , wherein the protecting device is arranged to supply the protective compound at a rate such that the first partial pressure of the protective compound in the vacuum chamber is less than about 10 −2 times the second partial pressure of hydrogen in the vacuum chamber.
7. The radiation source of claim 1 , wherein the radiation generating element is a discharge produced plasma (DPP) source.
8. The radiation source of claim 1 , wherein the radiation generating element is arranged to produce an electrical discharge through the fuel.
9. A lithographic apparatus constructed and arranged to project a patterned beam onto a substrate, the apparatus comprising:
a vacuum chamber enclosing a fuel and a component comprising a non-inert material;
a gas supply arranged to supply a background gas that can react with the non-inert material and the fuel to the vacuum chamber; and
a protecting device arranged to supply a trace amount of a protective compound to the vacuum chamber,
wherein a temperature inside the vacuum chamber, a first partial pressure of the protective compound in the vacuum chamber, and a second partial pressure of the background gas in the vacuum chamber are such that the protective compound preferentially bonds to the non-inert material rather than the background gas and such that the fuel remains in a non-oxidized state inside the vacuum chamber.
10. The lithographic apparatus according to claim 9 , wherein the gas supply is arranged to supply hydrogen and the protecting device is arranged to supply a protective compound selected from the group consisting of H 2 O, H 2 O 2 , O 2 , NH 3 , NO x , O 3 , CO 2 and LOX.
11. The lithographic apparatus according to claim 9 , wherein the non-inert material is selected from the group consisting of titanium, steel, samarium-cobalt, neodynium and silicon.
12. The lithographic apparatus according to claim 9 , wherein the vacuum chamber encloses an illumination system arranged to project a radiation beam onto a patterning means.
13. The lithographic apparatus according to claim 9 , wherein the vacuum chamber encloses a projection system arranged to project an image of a patterning means onto a substrate.
14. A device manufacturing method using a lithographic apparatus, the method comprising:
projecting a patterned radiation beam onto a substrate;
providing hydrogen to a vacuum chamber of the lithographic apparatus traversed by the radiation beam, the vacuum chamber including a fuel and a component comprising a non-inert material;
providing a trace amount of a protective compound to the vacuum chamber, and
setting a temperature inside the vacuum chamber, a first partial pressure of the protective compound in the vacuum chamber, and a second partial pressure of hydrogen in the vacuum chamber such that the protective compound preferentially bonds to the non-inert material rather than the background gas and such that the fuel remains in a non-oxidized state inside the vacuum chamber.
15. A lithographic apparatus, comprising:
a vacuum chamber enclosing a component comprising a non-inert material and a radiation modifying element comprising a fuel;
a gas supply arranged to supply hydrogen to the vacuum chamber; and
a protecting device arranged to supply a trace amount of a protective compound to the vacuum chamber,
wherein a temperature inside the vacuum chamber, a first partial pressure of the protective compound in the vacuum chamber, and a second partial pressure of the background gas in the vacuum chamber are such that the protective compound preferentially bonds to the chamber rather than hydrogen and are such that the fuel remains in an non-oxidized state inside the vacuum chamber.
16. A device manufacturing method using a lithographic apparatus, the method, comprising:
projecting a patterned radiation beam onto a substrate;
providing hydrogen to a chamber that encloses a radiation generating element comprising a fuel and a component comprising a non-inert material, the chamber traversed by the radiation beam;
providing a trace amount of a protective compound to the chamber; and
setting a temperature inside the chamber, a first partial pressure of the protective compound in the chamber, and a second partial pressure of hydrogen in the chamber such that the protective compound preferentially bonds to the non-inert material rather than hydrogen and such that the fuel remains in a non-oxidized state inside the chamber.