IP Library › Granted Patent US 9,203,028
Granted Patent B2
US 9,203,028 · App. 14/370,875 · Granted Dec 1, 2015

Method for producing vapor deposition mask, and method for producing organic semiconductor element

Inventors: Toshihiko Takeda (Tokyo, JP); Hiroyuki Nishimura (Tokyo, JP); Katsunari Obata (Tokyo, JP)
Assignee: DAI NIPPON PRINTING CO., LTD.
H01L51/0011C23C14/042C23C16/042C23F1/02C23F1/12C23F1/14H01L51/56
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Quick Facts
Patent No.
US 9,203,028
App. No.
14/370,875
Granted
Dec 1, 2015
Kind
B2
Abstract

A method for producing a vapor deposition mask capable of satisfying both enhancement in definition and reduction in weight even when a size is increased, and a method for producing an organic semiconductor element capable of producing an organic semiconductor element with high definition are provided. A vapor deposition mask is produced by the steps of preparing a metal plate with a resin layer in which a resin layer is provided on one surface of a metal plate, forming a metal mask with a resin layer by forming a slit that penetrates through only the metal plate, for the metal plate in the metal plate with a resin layer, and thereafter, forming a resin mask by forming openings corresponding to a pattern to be produced by vapor deposition in a plurality of rows lengthwise and crosswise in the resin layer by emitting a laser from the metal mask side.

Claims (31)

1. A method for producing a vapor deposition mask that is formed by a metal mask provided with a slit, and a resin mask that is positioned on a front surface of the metal mask, and has openings corresponding to a pattern to be produced by vapor deposition arranged by lengthwise and crosswise in a plurality of rows being stacked on each other, comprising the steps of:

preparing a metal plate with a resin layer in which a resin layer is provided on one surface of the metal plate;

forming a metal mask with a resin layer by forming a slit that penetrates through only the metal plate, for the metal plate in the metal plate with a resin layer; and

forming a resin mask by forming the openings corresponding to a pattern to be produced by vapor deposition in a plurality of rows lengthwise and crosswise in the resin layer by emitting a laser from the metal mask side.

2. The method for producing a vapor deposition mask according to claim 1 ,

wherein the step of forming the metal mask with a resin layer is

a step of forming a resist pattern by coating a surface where a resin layer is not provided, of the metal plate with the resin layer, with a resist material, masking the resist material with use of a mask in which a slit pattern is formed, and forming a resist pattern to performing exposure and development, subjecting the metal plate to etching processing with use of the resist pattern as an etching resistant mask, and cleaning and removing the resist pattern after etching is finished.

3. The method for producing a vapor deposition mask according to claim 1 ,

wherein the step of forming the metal mask with a resin layer is

a step of forming a resist pattern by coating a surface where a resin layer is not provided, of the metal plate with a resin layer, with a resist material, masking the resist material with use of a mask in which a slit pattern is formed, and forming a resist pattern to performing exposure and development, subjecting the metal plate to etching processing with use of the resist pattern as an etching resistant mask, and allowing the resist pattern to remain on a front surface of the metal plate even after etching is finished.

4. The method for producing a vapor deposition mask according to claim 1 , further comprising the step of:

fixing the metal mask with a resin layer onto a frame containing a metal, after the metal mask with a resin layer is obtained in the step of forming the metal mask with a resin layer,

wherein after the metal mask with a resin layer is fixed to the frame, the step of forming the resin mask is performed.

5. A method for producing an organic semiconductor element, comprising:

manufacturing the vapor deposition mask that is produced according to the production method according to claim 1 .

6. The method for producing a vapor deposition mask according to claim 2 , further comprising the step of:

fixing the metal mask with a resin layer onto a frame containing a metal, after the metal mask with a resin layer is obtained in the step of forming the metal mask with a resin layer,

wherein after the metal mask with a resin layer is fixed to the frame, the step of forming the resin mask is performed.

7. The method for producing a vapor deposition mask according to claim 3 , further comprising the step of:

fixing the metal mask with a resin layer onto a frame containing a metal, after the metal mask with a resin layer is obtained in the step of forming the metal mask with a resin layer,

wherein after the metal mask with a resin layer is fixed to the frame, the step of forming the resin mask is performed.

8. A method for producing an organic semiconductor element, comprising:

manufacturing the vapor deposition mask that is produced according to the production method according to claim 2 .

9. A method for producing an organic semiconductor element, comprising:

manufacturing the vapor deposition mask that is produced according to the production method according to claim 3 .

10. A method for producing an organic semiconductor element, comprising:

manufacturing the vapor deposition mask that is produced according to the production method according to claim 4 .

11. A method for producing an organic semiconductor element, comprising:

manufacturing the vapor deposition mask that is produced according to the production method according to claim 6 .

12. A method for producing an organic semiconductor element, comprising:

manufacturing the vapor deposition mask that is produced according to the production method according to claim 7 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 7, 2014
From: TAKEDA, TOSHIHIKO; NISHIMURA, HIROYUKI; OBATA, KATSUNARI
To: DAI NIPPON PRINTING CO., LTD.
Reel/Frame 033252/0055 →
Priority Claims (1)
JP 2012-004486 · Jan 12, 2012 · national
Continuity (1)
Related Publication 20140377903A1 · Dec 25, 2014