Selective etch of silicon nitride
A method of etching silicon nitride on patterned heterogeneous structures is described and includes a remote plasma etch formed from a fluorine-containing precursor and a nitrogen-and-oxygen-containing precursor. Plasma effluents from two remote plasmas are flowed into a substrate processing region where the plasma effluents react with the silicon nitride. The plasmas effluents react with the patterned heterogeneous structures to selectively remove silicon nitride while very slowly removing silicon, such as polysilicon. The silicon nitride selectivity results partly from the introduction of fluorine-containing precursor and nitrogen-and-oxygen-containing precursor using distinct (but possibly overlapping) plasma pathways which may be in series or in parallel.
1. A method of etching a patterned substrate having exposed silicon nitride in a substrate processing region of a substrate processing chamber, the method comprising:
flowing a nitrogen-and-oxygen-containing precursor into a first remote plasma region fluidly coupled to a second remote plasma region while forming a first remote plasma in the first remote plasma region to produce oxidizing plasma effluents;
flowing a fluorine-containing precursor into the second remote plasma region fluidly coupled to the substrate processing region while forming a second remote plasma in the second remote plasma region to produce etching plasma effluents, wherein the oxidizing plasma effluents are further excited in the second remote plasma;
flowing each of the oxidizing plasma effluents and the etching plasma effluents into the substrate processing region through through-holes in a showerhead; and
etching the exposed silicon nitride.
2. The method of claim 1 wherein the nitrogen-and-oxygen-containing precursor comprises one of N 2 O, NO, NO 2 or N 2 O 2 .
3. The method of claim 1 wherein the first remote plasma is an inductively-coupled plasma.
4. The method of claim 1 wherein the second remote plasma is a capacitively-coupled plasma.
5. The method of claim 1 wherein a selectivity of the etching operation (exposed silicon nitride: exposed silicon) is greater than or about 20:1.
6. The method of claim 1 wherein the fluorine-containing precursor comprises NF 3 .
7. The method of claim 1 wherein the fluorine-containing precursor comprises a precursor selected from the group consisting of hydrogen fluoride, atomic fluorine, diatomic fluorine, carbon tetrafluoride and xenon difluoride.
8. A method of etching a patterned substrate having exposed silicon nitride and exposed silicon in a substrate processing region of a substrate processing chamber, the method comprising:
flowing a nitrogen-and-oxygen-containing precursor into a first remote plasma region while forming a first remote plasma in the first remote plasma system to produce oxidizing plasma effluents;
flowing a fluorine-containing precursor into a second remote plasma region, distinct from the first remote plasma region, while forming a second remote plasma in the second remote plasma region to produce radical-fluorine;
combining the oxidizing plasma effluents with the radical-fluorine in the substrate processing chamber, wherein the oxidizing plasma effluents and the radical-fluorine are flowed through separate channels of a multi-channel showerhead; and
selectively etching the exposed silicon nitride at a greater etch rate than the exposed silicon.
9. The method of claim 8 wherein the radical-fluorine and the oxidizing plasma effluents do not encounter one another prior to entering the substrate processing region.
10. The method of claim 8 wherein the nitrogen-and-oxygen-containing precursor consists of nitrogen and oxygen.
11. The method of claim 8 wherein the nitrogen-and-oxygen-containing precursor comprises one of N 2 O, NO, NO 2 or N 2 O 2 .
12. The method of claim 8 wherein the first remote plasma is an inductively-coupled plasma, and the second remote plasma is a capacitively-coupled plasma.
13. The method of claim 8 wherein the fluorine-containing precursor comprises NF 3 .
14. The method of claim 8 wherein the fluorine-containing precursor comprises a precursor selected from the group consisting of hydrogen fluoride, atomic fluorine, diatomic fluorine, carbon tetrafluoride and xenon difluoride.
15. A method of etching a patterned substrate having exposed silicon nitride and exposed silicon in a substrate processing region of a substrate processing chamber, the method comprising:
flowing N 2 O into a first remote plasma disposed outside the substrate processing chamber to produce oxidizing plasma effluents;
flowing NF 3 into a second remote plasma, separate from the first remote plasma, to produce fluorine-containing plasma effluents, wherein the NF 3 is substantially not excited in the first remote plasma;
combining the oxidizing plasma effluents with the fluorine-containing plasma effluents in the substrate processing chamber;
selectively etching the exposed silicon nitride relative to the exposed silicon.