Systems and methods for detecting small pattern changes in sensed data
View Patent ↗In one embodiment, a system and a method involve receiving a raw signal collected by a sensor that pertains to a temporal trend, creating a reference signal of a known amplitude and frequency, adding the reference signal to the raw signal to form a modulated signal, decomposing the modulated signal to obtain a decomposed signal, and conducting time-frequency analysis on the decomposed signal to detect abnormal patterns.
1. A method for detecting an environmental condition from sensed data, the method comprising:
monitoring a structure with a sensor to collect a raw signal that is generated by the structure and an environment in which the structure, the raw signal pertaining to a temporal trend of the structure and comprising an obfuscated event signal associated with a first environmental condition effecting the structure that has a small impact on the raw signal and a dominate sensor masking signal associated with a second environmental condition which obfuscates the first environmental condition;
modulating the raw signal with a reference signal to the raw signal to form a modulated signal that comprises the obfuscated event signal, the reference signal being a signal with a user-defined frequency;
decomposing the modulated signal to obtain a decomposed signal;
conducting time-frequency analysis on the decomposed signal to detect the obfuscated event signal and, thereby, the first environmental condition effecting the structure; and
interpreting the obfuscated event signal to identify the nature of the first environmental condition effecting the structure.
2. The method of claim 1 , wherein the raw data comprises displacement data or temperature data that quantifies displacement or temperature of the monitored structure over a period of time.
3. The method of claim 1 , wherein the reference signal comprises one of a sinusoidal, sine-sweep, beating, square, sawtooth, or broadband random function.
4. The method of claim 1 , wherein the modulating comprises physically modulating a mechanical actuator using the reference signal.
5. The method of claim 1 , wherein the modulating comprises synthetically mixing the reference signal with the raw signal using a computer.
6. The method of claim 1 , wherein the decomposing of the modulated signal comprises performing a non-stationary decomposition technique on the modulated signal.
7. The method of claim 6 , wherein the non-stationary decomposition technique comprises wavelet decomposition (WD) or empirical mode decomposition (EMD).
8. The method of claim 1 , wherein conducting time-frequency analysis comprises processing the decomposed signal using Hilbert-Huang transformation (HHT).
9. A non-transitory computer-readable medium that stores an auto-modulating pattern (AMP) detection algorithm, the computer-readable medium comprising:
logic configured to modulate a raw signal with a reference to form a modulated signal, the raw signal collected by a sensor associated with a structure and generated by the structure and an environment in which the structure exists, the raw signal pertaining to a temporal trend of the structure and comprising an obfuscated event signal associated with a first environmental condition effecting the structure that has a small impact on the raw signal and a dominate sensor masking signal associated with a second environmental condition which obfuscates the first environmental condition, wherein the modulated signal comprises the obfuscated event signal and wherein the reference signal being a signal having a user-defined frequency;
logic configured to decompose the modulated signal to obtain a decomposed signal; and
logic configured to conduct time-frequency analysis on the decomposed signal to detect the obfuscated event signal and, thereby, the first environmental condition effecting the structure.
10. The computer-readable medium of claim 9 , wherein the logic configured to add a reference signal is configured to add one of a sinusoidal, sine-sweep, beating, square, sawtooth, or broadband random function to the raw signal.
11. The computer-readable medium of claim 9 , wherein the logic configured to modulate the raw signal with the reference signal is configured to synthetically mix the reference signal with the raw signal.
12. The computer-readable medium of claim 9 , wherein the logic configured to decompose the modulated signal comprises logic configured to perform a non-stationary decomposition technique.
13. The computer-readable medium of claim 12 , wherein the logic configured to perform non-stationary decomposition technique comprises logic configured to perform wavelet decomposition (WD) or empirical mode decomposition (EMD) on the modulated signal.
14. The computer-readable medium of claim 9 , wherein the logic configured to conduct time-frequency analysis comprises logic configured to process the decomposed signal using Hilbert-Huang transformation (HHT).
15. The computer-readable medium of claim 9 , further comprising logic configured to interpret the obfuscated event signal and identify the nature of the environmental condition effecting the structure.
16. An auto-modulating pattern (AMP) sensor, comprising:
a sensor element to collect a raw signal from a structure that is generated by the structure and an environment in which the structure exists, the raw signal pertaining to a temporal trend of the structure and comprising an obfuscated event signal associated with a first environmental condition effecting the structure that has a small impact on the raw signal and a dominate sensor masking signal associated with a second environmental condition which obfuscates the first environmental condition; and
a processing device that is embedded with an AMP detection algorithm, the algorithm being configured to modulate the raw signal with a reference to form a modulated signal that comprises the obfuscated event signal, to decompose the modulated signal to obtain a decomposed signal, and to conduct time-frequency analysis on the decomposed signal to detect the obfuscated event signal and, thereby, the environmental condition effecting the structure wherein the reference signal being a signal with a user-defined frequency.
17. The sensor of claim 16 , wherein the sensor element is configured to measure displacement.
18. The sensor of claim 16 , wherein the sensor element is configured to measure temperature.
19. The sensor of claim 16 , further comprising a communication unit with which the sensor can communicate data to a remote computing device.