IP Library Granted Patent US 9,240,402
Granted Patent B2
US 9,240,402 · App. 14/531,754 · Granted Jan 19, 2016

Electronic circuits including a MOSFET and a dual-gate JFET

Inventors: Denis A. Masliah (St.-Germain en Laye, FR); Alexandre G. Bracale (Paris, FR)
H01L27/0617H01L29/78H01L29/808H03F1/0266H03F1/223H03F1/56H03F3/195H03F3/1935H03F3/245H01L27/095H01L27/098H03F2200/18H03F2200/222H03F2200/387
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,240,402
App. No.
14/531,754
Granted
Jan 19, 2016
Kind
B2
Abstract

Electronic circuits and methods are provided for various applications including signal amplification. An exemplary electronic circuit comprises a MOSFET and a dual-gate JFET in a cascode configuration. The dual-gate JFET includes top and bottom gates disposed above and below the channel. The top gate of the JFET is controlled by a signal that is dependent upon the signal controlling the gate of the MOSFET. The control of the bottom gate of the JFET can be dependent or independent of the control of the top gate. The MOSFET and JFET can be implemented as separate components on the same substrate with different dimensions such as gate widths.

Claims (17)

1. A MOS device comprising:

a substrate including a first well defined within the substrate, the well characterized by a top surface and having, defined within the well—

a bottom gate,

a first channel defined between the bottom gate and the top surface,

a first source,

a first drain,

a second drain between the first drain and the first source,

a first gate between the first drain and the second drain, and

a gap between the first source and the second drain;

a dielectric layer disposed above the top surface of the first well and aligned with the gap;

a second gate disposed above the dielectric layer and aligned with the gap; and

a first sidewall and a second sidewall both defined within the first well and both joined to the bottom gate, the bottom gate and two sidewalls defining a second well within the first well.

2. The MOS device of claim 1 wherein the first source, first and second drains, and first gate are all disposed within the second well.

3. The MOS device of claim 1 further comprising a second channel, both channels disposed within the second well, the first and second channels comprising different dopings.

4. The MOS device of claim 3 wherein the first channel provides electrical conduction between the second drain and the first drain and is controlled by the first gate, and the second channel provides electrical conduction between the first source and the second drain and is controlled by the second gate.

5. The MOS device of claim 1 wherein the second gate comprises polysilicon.

6. The MOS device of claim 1 further comprising a first electrical contact disposed on the top surface in contact with the first sidewall.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 10, 2021
From: SOMOS SEMICONDUCTOR SAS
To: STMICROELECTRONICS INTERNATIONAL N.V.
Reel/Frame 055220/0856 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 10, 2020
From: ACCO
To: SOMOS SEMICONDUCTOR
Reel/Frame 053178/0925 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 28, 2015
From: ACCO SEMICONDUCTOR INC.
To: ACCO
Reel/Frame 037370/0275 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 5, 2014
From: MASLIAH, DENIS A.; BRACALE, ALEXANDRE G.
To: ACCO SEMICONDUCTOR, INC.
Reel/Frame 034106/0930 →
Continuity (7)
Continuation In Part 13803792 · Mar 14, 2013
Division 13443611 · Apr 10, 2012
Continuation 13107411 · May 13, 2011
Division 12686573 · Jan 13, 2010
Provisional Application 61171689 · Apr 22, 2009
Provisional Application 61923579 · Jan 3, 2014
Related Publication 20150054038A1 · Feb 26, 2015