IP Library › Granted Patent US 9,245,610
Granted Patent B2
US 9,245,610 · App. 13/613,168 · Granted Jan 26, 2016

OTP cell with reversed MTJ connection

Inventors: Jung Pill Kim (San Diego, CA); Taehyun Kim (San Diego, CA); Kangho Lee (San Diego, CA); Seung H. Kang (San Diego, CA); Xia Li (San Diego, CA); Wah Nam Hsu (San Diego, CA)
Assignee: QUALCOMM Incorporated
G11C11/1675G11C11/16G11C17/02G11C17/16G11C17/165
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Quick Facts
Patent No.
US 9,245,610
App. No.
13/613,168
Granted
Jan 26, 2016
Kind
B2
Abstract

A one time programming (OTP) apparatus unit cell includes magnetic tunnel junctions (MTJs) with reversed connections for placing the MTJ in an anti-parallel resistance state during programming. Increased MTJ resistance in its anti-parallel resistance state causes a higher programming voltage which reduces programming time and programming current.

Claims (23)

1. An anti-fuse memory, comprising:

an anti-fuse magnetic tunnel junction (MTJ) memory cell; and

a programming driver configured to drive the anti-fuse MTJ memory cell with a programming voltage, wherein the anti-fuse MTJ memory cell is configured to switch into an anti-parallel state in response to being driven with the programming voltage, and wherein the programming driver is further configured to drive the anti-fuse MTJ memory cell with the programming voltage so as to break down a dielectric barrier in the anti-fuse MTJ memory cell after the anti-fuse MTJ memory cell switches into the anti-parallel state.

2. The anti-fuse memory of claim 1 , further comprising:

a bit line coupled to a first terminal of the anti-fuse MTJ memory cell;

an access transistor coupled between a second terminal of the anti-fuse MTJ memory cell and ground;

wherein the bit line comprises an upper metal layer, and a free layer in the first memory cell is coupled to a lower metal layer that is coupled to the access transistor.

3. The anti-fuse memory of claim 1 , further comprising:

a bit line coupled to a first terminal of the anti-fuse MTJ memory cell;

an access transistor coupled between a second terminal of the anti-fuse MTJ memory cell and ground;

wherein the bit line is a lower metal layer, and a free layer in the anti-fuse MTJ memory cell is coupled to an upper metal layer that is coupled to the access transistor.

4. The anti-fuse memory of claim 2 , further comprising:

sense amplifier circuitry coupled to the bit line.

5. The anti-fuse memory of claim 1 , integrated in a mobile phone, a set top box, a music player, a video player, an entertainment unit, a navigation device, a computer, a hand-held personal communication systems (PCS) unit, a portable data unit, and/or a fixed location data unit.

6. A method of programming an anti-fuse magnetic tunnel junction (MTJ) memory cell, comprising:

applying a voltage to a bit line;

asserting a word line to switch on an access transistor;

switching a state of the anti-fuse MTJ memory cell to an anti-parallel (AP) state in response to the asserting of the word line and the applying of the voltage to the bit line; and

after switching the MTJ state to the anti-parallel state, breaking down a dielectric barrier layer of the anti-fuse MTJ memory cell in response to applying the voltage.

7. The method of claim 6 , further comprising coupling the access transistor to a fixed potential.

8. The method of claim 7 , comprising coupling the access transistor to a ground potential.

9. The method of claim 6 , further comprising coupling a programmable driver to the bit line.

10. The method of claim 6 , further comprising integrating the one time programmable cell into a mobile phone, a set top box, a music player, a video player, an entertainment unit, a navigation device, a computer, a hand-held personal communication systems (PCS) unit, a portable data unit, and/or a fixed location data unit.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 6, 2012
From: KIM, JUNG PILL; KIM, TAEHYUN; LEE, KANGHO; KANG, SEUNG H.; LI, XIA; HSU, WAH NAM
To: QUALCOMM INCORPORATED
Reel/Frame 029244/0518 →
Continuity (1)
Related Publication 20140071741A1 · Mar 13, 2014