Method for manufacturing semiconductor device
A method for manufacturing a semiconductor device including an oxide semiconductor includes the steps of forming an oxide semiconductor film, forming a gate insulating film provided over the oxide semiconductor film, forming a gate electrode in contact with the gate insulating film, a sidewall insulating film in contact with the gate electrode, and forming a source electrode and a drain electrode in contact with the oxide semiconductor film. In the method, the gate insulating film and the sidewall insulating film are formed at a temperature at which oxygen contained in the oxide semiconductor film is inhibited from being eliminated, preferably at a temperature lower than a temperature at which oxygen contained in the oxide semiconductor film is eliminated.
1. A method for manufacturing a semiconductor device comprising the steps of:
forming an oxide semiconductor film over a substrate having an insulating surface;
forming an insulating film over the oxide semiconductor film so that the insulating film covers an edge portion of the oxide semiconductor film;
exposing the insulating film and the oxide semiconductor film to plasma generated under an atmosphere containing oxygen;
forming a gate insulating film over the oxide semiconductor film at a temperature lower than a temperature at which oxygen contained in the oxide semiconductor film is eliminated after the step of exposing the insulating film and the oxide semiconductor film to plasma;
forming a gate electrode overlapping with the oxide semiconductor film with the gate insulating film interposed therebetween; and
forming a source wiring and a drain wiring electrically connected the oxide semiconductor film,
wherein the edge portion of the insulating film is curved, and
wherein the gate insulating film is formed by using plasma generated by a microwave.
2. The method for manufacturing a semiconductor device according to claim 1 , wherein, when the gate insulating film is formed, the substrate is heated at 200° C. to 400° C.
3. The method for manufacturing a semiconductor device according to claim 1 , wherein, after the gate insulating film is formed, the gate insulating film is exposed by plasma generated under an atmosphere containing one or both of oxygen and nitrogen.
4. The method for manufacturing a semiconductor device according to claim 1 , wherein the gate insulating film is an oxide insulating film.
5. The method for manufacturing a semiconductor device according to claim 1 , wherein a dopant is introduced into the oxide semiconductor film with the gate electrode used as a mask.
6. The method for manufacturing a semiconductor device according to claim 5 , wherein the dopant is one or more elements selected from a group consisting of boron, nitrogen, fluorine, aluminum, phosphorus, arsenic, indium, tin, antimony, and a rare gas element.
7. A method for manufacturing a semiconductor device comprising the steps of:
forming an oxide semiconductor film over a substrate having an insulating surface;
forming a first insulating film over the oxide semiconductor film so that the first insulating film covers an edge portion of the oxide semiconductor film;
exposing the first insulating film and the oxide semiconductor film to plasma generated under an atmosphere containing oxygen;
forming a gate insulating film over the oxide semiconductor film after the step of exposing the first insulating film and the oxide semiconductor film to plasma;
forming a gate electrode overlapping with the oxide semiconductor film with the gate insulating film interposed therebetween;
forming a second insulating film covering the gate electrode at a temperature lower than a temperature at which oxygen contained in the oxide semiconductor film is eliminated;
forming a side wall insulating film in contact with a side surface of the gate electrode by etching the second insulating film; and
forming a source wiring and a drain wiring electrically connected the oxide semiconductor film,
wherein the edge portion of the first insulating film is curved, and
wherein the second insulating film is formed by using plasma generated by a microwave.
8. The method for manufacturing a semiconductor device according to claim 7 , wherein the gate insulating film is formed at a temperature lower than a temperature at which oxygen contained in the oxide semiconductor film is eliminated.
9. The method for manufacturing a semiconductor device according to claim 7 , wherein, when the second insulating film is formed, the substrate is heated at 200° C. to 400° C.
10. The method for manufacturing a semiconductor device according to claim 7 , wherein, after the second insulating film is formed, the substrate is exposed by plasma generated under an atmosphere containing one or both of oxygen and nitrogen.
11. The method for manufacturing a semiconductor device according to claim 7 , wherein the second insulating film is an oxide insulating film.
12. The method for manufacturing a semiconductor device according to claim 7 , wherein a dopant is introduced into the oxide semiconductor film with the gate electrode used as a mask.
13. The method for manufacturing a semiconductor device according to claim 12 , wherein the dopant is one or more elements selected from a group consisting of boron, nitrogen, fluorine, aluminum, phosphorus, arsenic, indium, tin, antimony, and a rare gas element.
14. The method for manufacturing a semiconductor device according to claim 1 , wherein the curved edge portion of the insulating film is formed by the step of exposing the insulating film and the oxide semiconductor film to plasma.
15. The method for manufacturing a semiconductor device according to claim 7 , wherein the curved edge portion of the first insulating film is formed by the step of exposing the first insulating film and the oxide semiconductor film to plasma.