IP Library › Granted Patent US 9,305,680
Granted Patent B2
US 9,305,680 · App. 13/976,839 · Granted Apr 5, 2016

Transparent conductive film and manufacturing method therefor

Inventors: Yuka Yamazaki (Ibaraki, JP); Yoko Muraoka (Ibaraki, JP); Hironobu Machinaga (Ibaraki, JP); Tomotake Nashiki (Ibaraki, JP); Tsukasa Miyazaki (Ibaraki, JP)
Assignee: NITTO DENKO CORPORATION
H01B5/14C23C14/024C23C14/086C23C14/5806
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Quick Facts
Patent No.
US 9,305,680
App. No.
13/976,839
Granted
Apr 5, 2016
Kind
B2
Abstract

The present invention relates to a transparent conductive film which is excellent in dotting property under a heavy load and excellent in bending resistance. Provided is a transparent conductive film, comprising a flexible transparent base; and a transparent conductive layer formed on the flexible transparent base and including a crystalline indium/tin composite oxide, wherein a compressive residual stress of the transparent conductive layer is 0.4 to 2 GPa.

Claims (12)

1. A transparent conductive film, comprising

a flexible transparent base; and

a transparent conductive layer formed on the flexible transparent base and including a crystalline indium/tin composite oxide,

wherein a compressive residual stress of the transparent conductive layer is 0.7 to 2 GPa,

wherein the transparent conductive layer is formed by a sputtering method,

wherein the transparent conductive layer is crystallized by heating, and a dimensional change in at least one direction in a plane of the layer with respect to a dimension before crystallization is −0.3% to −1.5%,

the flexible transparent base comprises a transparent substrate film and an undercoat layer, and

the undercoat layer comprises an organic substance or a mixture of an inorganic substance and an organic substance.

2. The transparent conductive film according to claim 1 , wherein the content of crystals having a maximum grain size of 300 nm or less is 95% by area or more.

3. The transparent conductive film according to claim 1 , wherein the content of crystals having a maximum grain size of 200 nm or less is more than 50% by area.

4. The transparent conductive film according to claim 1 , wherein the content of crystals having a maximum grain size of 100 nm or less is more than 5% by area, and the maximum grain size of remaining crystals falls within a distribution range of more than 100 nm and 200 nm or less.

5. The transparent conductive film according to claim 1 , wherein the thickness of the transparent conductive layer is 10 to 100 nm.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 28, 2013
From: YAMAZAKI, YUKA; MURAOKA, YOKO; MACHINAGA, HIRONOBU; NASHIKI, TOMOTAKE; MIYAZAKI, TSUKASA
To: NITTO DENKO CORPORATION
Reel/Frame 030711/0532 →
Priority Claims (2)
JP 2010-290499 · Dec 27, 2010 · national
JP 2011-050469 · Mar 8, 2011 · national
Continuity (1)
Related Publication 20130280554A1 · Oct 24, 2013