Image sensor with dielectric charge trapping device
An image sensor pixel includes a photosensitive element, a floating diffusion region, a transfer gate, a dielectric charge trapping region, and a first metal contact. The photosensitive element is disposed in a semiconductor layer to receive electromagnetic radiation along a vertical axis. The floating diffusion region is disposed in the semiconductor layer, while the transfer gate is disposed on the semiconductor layer to control a flow of charge produced in the photosensitive element to the floating diffusion region. The dielectric charge trapping device is disposed on the semiconductor layer to receive electromagnetic radiation along the vertical axis and to trap charges in response thereto. The dielectric charge trapping device is further configured to induce charge in the photosensitive element in response to the trapped charges. The first metal contact is coupled to the dielectric charge trapping device to provide a first bias voltage to the dielectric charge trapping device.
1. An image sensor pixel, comprising:
a photosensitive element disposed in a semiconductor layer to receive electromagnetic radiation of a first type along a vertical axis;
a floating diffusion region disposed in the semiconductor layer;
a transfer gate disposed on the semiconductor layer between the photosensitive element and the floating diffusion region to control a flow of charge produced in the photosensitive element to the floating diffusion region;
a dielectric charge trapping device disposed on the semiconductor layer to receive electromagnetic radiation of a second type along the vertical axis and to trap charges in response to the electromagnetic radiation of the second type, wherein the dielectric charge trapping device is further configured to induce charge in the photosensitive element in response to the trapped charges;
a first metal contact coupled to the dielectric charge trapping device to provide a first bias voltage to the dielectric charge trapping device; and
a light source coupled to emit an optical erase signal along the vertical axis to erase charge trapped in the dielectric charge trapping device, wherein the light source comprises:
a light emitting diode; and
a waveguide optically coupled to the light emitting diode and configured to emit the optical erase signal along the vertical axis.
2. The image sensor pixel of claim 1 , further comprising a source follower transistor having a drain region, wherein the first metal contact is coupled to the drain region to provide the first bias voltage to the drain region.
3. The image sensor pixel of claim 1 , further comprising an oxide layer disposed on a surface of the semiconductor layer, wherein the dielectric charge trapping device is disposed on the oxide layer.
4. The image sensor pixel of claim 1 , further comprising a second metal contact coupled to the transfer gate to control a transfer of charge from the photosensitive region to the floating diffusion region, wherein the dielectric charge trapping device overlaps at least a portion of the transfer gate and is coupled to the second metal contact to receive a second bias voltage.
5. The image sensor pixel of claim 1 , wherein the optical erase signal is blue light having a wavelength of about 405 nanometers.
6. The image sensor pixel of claim 1 , wherein the electromagnetic radiation of the first type includes visible light and the electromagnetic radiation of the second type includes infrared light.
7. The image sensor pixel of claim 1 , wherein the electromagnetic radiation of the second type includes x-rays.
8. The image sensor pixel of claim 1 , wherein the dielectric charge trapping device includes at least one dielectric selected from the group consisting of Silicon Nitride (SiN), Hafnium Oxide (HfO), Tantalum Oxide (TaO), Silicon Oxide (SiO), and Silicon Oxy-Nitride (SiON).
9. The image sensor pixel of claim 1 , wherein the first metal contact includes at least one metal selected from the group consisting of titanium (Ti), tungsten (W), and aluminum (Al).
10. The image sensor pixel of claim 1 , wherein the image sensor pixel is a backside illuminated image sensor pixel wherein the electromagnetic radiation of the first and second types are incident on a backside of the semiconductor layer and wherein a first side of the dielectric charge trapping device is disposed on the backside of the semiconductor layer, wherein the light source coupled to emit an optical erase signal along the vertical axis is configured such that the optical erase signal is incident on a second side of the dielectric charge trapping device.
11. The image sensor pixel of claim 1 , wherein the image sensor pixel is a backside illuminated image sensor pixel wherein the electromagnetic radiation of the first and second types are incident on a backside of the semiconductor layer and wherein a first side of the dielectric charge trapping device is disposed on a frontside of the semiconductor layer, wherein the light source coupled to emit an optical erase signal along the vertical axis is configured such that the optical erase signal is incident on a second side of the dielectric charge trapping device.
12. The image sensor pixel of claim 1 , wherein the photosensitive element includes a pinned photodiode.
13. An image sensor comprising:
a complementary metal-oxide-semiconductor (“CMOS”) array of image sensor pixels, wherein each of the image sensor pixels includes:
a photosensitive element disposed in a semiconductor layer of the image sensor to receive electromagnetic radiation of a first type along a vertical axis;
a floating diffusion region disposed in the semiconductor layer;
a transfer gate disposed on the semiconductor layer between the photosensitive element and the floating diffusion region to control a flow of charge produced in the photosensitive element to the floating diffusion region;
a dielectric charge trapping device disposed on the semiconductor layer to receive electromagnetic radiation of a second type along the vertical axis and to trap charges in response to the electromagnetic radiation of the second type, wherein the dielectric charge trapping device is further configured to induce charge in the photosensitive element in response to the trapped charges;
a first metal contact coupled to the dielectric charge trapping device to provide a first bias voltage to the dielectric charge trapping device; and
a light source coupled to emit an optical erase signal along the vertical axis to erase charge trapped in each dielectric charge trapping device, wherein the light source comprises:
a light emitting diode; and
a waveguide optically coupled to the light emitting diode and configured to emit the optical erase signal along the vertical axis.
14. The image sensor of claim 13 , wherein each image sensor pixel further comprises a source follower transistor having a drain region, wherein each first metal contact is further coupled to the drain region of a respective source follower transistor to provide the first bias voltage to the drain region.
15. The image sensor of claim 13 , further comprising an oxide layer disposed on a surface of the semiconductor layer, wherein the dielectric charge trapping device is disposed on the oxide layer.
16. The image sensor of claim 13 , wherein each image sensor pixel further comprises a second metal contact coupled to the transfer gate to control a transfer of charge from the photosensitive region to the floating diffusion region, wherein the dielectric charge trapping device overlaps at least a portion of the transfer gate and is coupled to the second metal contact to receive a second bias voltage.
17. The image sensor of claim 13 , wherein the electromagnetic radiation of the first type includes visible light and the electromagnetic radiation of the second type includes infrared light.
18. The image sensor of claim 13 , wherein the electromagnetic radiation of the second type includes x-rays.
19. The image sensor of claim 13 , wherein each dielectric charge trapping device includes at least one dielectric selected from the group consisting of Silicon Nitride (SiN), Hafnium Oxide (HfO), Tantalum Oxide (TaO), Silicon Oxide (SiO), and Silicon Oxy-Nitride (SiON).
20. The image sensor of claim 13 , wherein the image sensor is a backside illuminated image sensor wherein the electromagnetic radiation of the first and second types are incident on a backside of the semiconductor layer and wherein a first side of the dielectric charge trapping device is disposed on the backside of the semiconductor layer, wherein the light source coupled to emit an optical erase signal along the vertical axis is configured such that the optical erase signal is incident on a second side of the dielectric charge trapping devices.
21. The image sensor of claim 13 , wherein the image sensor is a backside illuminated image sensor wherein the electromagnetic radiation of the first and second types are incident on a backside of the semiconductor layer and wherein a first side of the dielectric charge trapping device is disposed on a frontside of the semiconductor layer, wherein the light source coupled to emit an optical erase signal along the vertical axis is configured such that the optical erase signal is incident on a second side of each dielectric charge trapping device.