Semiconductor device, physical quantity sensor, electronic apparatus, and moving object

1. A semiconductor device comprising:

a digital circuit having a scan test mode and a normal operation mode different from the scan test mode; and

an analog circuit having an interface with the digital circuit, wherein:

the digital circuit includes:

a first flip-flop that forms a part of a scan chain when in the scan test mode,

a first selector provided on an input side of the first flip-flop and capable of selecting a first signal when in the normal operation mode, and capable of selecting a second signal that is different from the first signal when in the scan test mode,

a second flip-flop that forms a part of the scan chain when in the scan test mode, and

a first logic element provided in a signal path extending from and between an output of the first selector to an input of the first flip-flop, further wherein:

the first signal is an input signal to the digital circuit from the analog circuit, and

the second signal is an output signal from the second flip-flop.

2. The semiconductor device according to claim 1 ,

wherein the second signal is an output signal from the digital circuit to the analog circuit.

3. The semiconductor device according to claim 1 , wherein the second signal is an input signal to a second logic element in which a logic level of an output signal is fixed when in the scan test mode.

4. The semiconductor device according to claim 1 , wherein the first signal is a signal in which a logic level is fixed when in the scan test mode.

5. The semiconductor device according to claim 1 , wherein the first selector constantly selects the second signal when in the scan test mode.

6. The semiconductor device according to claim 1 , wherein the digital circuit includes a third flip-flop that forms a part of the scan chain when in the scan test mode, and

the first selector selects the first signal or the second signal in response to an output signal from the third flip-flop when in the scan test mode.

7. The semiconductor device according to claim 1 , wherein the second signal is an output signal from a multiple-input logic circuit that does not function when not in the scan test mode.

8. The semiconductor device according to claim 7 , wherein at least a part of input signals to the multiple-input logic circuit is an output signal from the digital circuit to the analog circuit, or an input signal to a second logic element in which a logic level of an output signal is fixed when in the scan test mode.

9. A physical quantity sensor comprising:

a sensor element that detects a physical quantity; and

the semiconductor device according to claim 1 that generates a signal corresponding to the physical quantity, based on a detection signal from the sensor element.

10. An electronic apparatus comprising the semiconductor device according to claim 1 .

11. A moving object comprising the semiconductor device according to claim 1 .